Datasheet
Serial EEPROM Series Standard EEPROM
WLCSP EEPROM
BU99901GUZ-W (32Kbit)
●General Description
BU99901GUZ-W series is a serial EEPROM of I2C BUS interface method.
●Features
Completely conforming to the world standard I2C BUS.
All controls available by 2 ports of serial clock (SCL) and serial data (SDA)
Other devices than EEPROM can be connected to the same port, saving microcontroller port.
1.7V to 3.6V single power source action most suitable for battery use.
FAST MODE :400kHz at 1.7V to 3.6V
Page write mode useful for initial value write at factory shipment.
Auto erase and auto end function at data rewrite.
Low current consumption
¾
¾
¾
At write operation (3.3V)
At read operation (3.6V)
At standby operation (3.6V)
: 0.6mA (Typ.)
: 0.6mA (Typ.)
: 0.1µA (Typ.)
Write mistake prevention function
¾
¾
Write (write protect) function added
Write mistake prevention function at low voltage
Compact package
¾
W(Typ.) x D(Typ.) x H(Max.)
: 1.76mm x 1.05mm x 0.35mm
Data rewrite up to 100,000 times
Data kept for 40 years
Noise filter built in SCL / SDA terminal
Shipment data all address FFh
●Page write
Product number
Number of pages
BU99901GUZ-W
32Byte
●Absolute Maximum Ratings (Ta=25℃)
Remarks
Parameter
symbol
Ratings
Unit
V
Impressed voltage
VCC
Pd
-0.3 to +6.5
When using at Ta=25℃ or higher 2.2mW to be reduced per 1℃.
Permissible dissipation
Storage temperature range
Action temperature range
Terminal voltage
220
mW
℃
Tstg
Topr
-
-65 to +125
-40 to +85
-0.3 to Vcc+1.0 *1
℃
V
*1
The Max value of Terminal Voltage is not over 6.5V.
●Memory cell characteristics (Ta=25℃, Vcc=1.7V to 3.6V)
Limits
Typ.
Parameter
Unit
Min.
Max.
Number of data rewrite times *1
Data hold years *1
100,000
-
-
Times
Years
40
-
-
*1 Not 100% TESTED
●Recommended Operating Ratings
Parameter
Symbol
Rating
Unit
V
Write(Ta=-40℃ to 85℃)
Write(Ta=-40℃ to 70℃)
Read(Ta=-40℃ to 85℃)
2.7 to 3.3
1.8 to 3.3
1.7 to 3.6
0 to Vcc
Supply Voltage
Input Voltage
Vcc
VIN
V
○Product structure:Silicon monolithic integrated circuit ○This product is not designed protection against radioactive rays
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4.SEP.2012 Rev.001
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