Datasheet > BU91797MUF-ME2

BU91797MUF-ME2

更新时间： 2024-01-01 11:56:31

品牌	Logo	应用领域
罗姆 - ROHM		驱动接口集成电路
页数	文件大小	规格书
27页	2367K
描述
Low Duty LCD Segment Driver for Automotive application

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技术参数
数据手册

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BU91797MUF-ME2 技术参数

是否Rohs认证：	符合	生命周期：	Active
Reach Compliance Code：	compliant	ECCN代码：	EAR99
HTS代码：	8542.39.00.01	Factory Lead Time：	13 weeks
风险等级：	2.25	接口集成电路类型：	LIQUID CRYSTAL DISPLAY DRIVER
峰值回流温度（摄氏度）：	NOT SPECIFIED	处于峰值回流温度下的最长时间：	NOT SPECIFIED
Base Number Matches：	1

BU91797MUF-ME2 数据手册

Datasheet

Low Duty LCD Segment Driver

for Automotive application

MAX 144 Segments (SEG36×COM4)

BU91797MUF-M

General Description

Key Specifications

BU91797MUF-M is a 1/4 duty general-purpose LCD

driver that can be used for automotive applications and

can drive up to 144 LCD Segments.

It can support operating temperature of up to +105°C and

qualified for AEC-Q100 Grade2, as required for

automotive applications.

■

Supply Voltage Range:

+2.5V to +6.0V

-40°C to +105°C

144Segments

Operating Temperature Range:

Max Segments:

Display Duty:

Bias:

Interface:

1/4

1/2, 1/3 selectable

2wire Serial Interface

Wettable flank QFN package is suitable for small

footprint applications and provides significant

advantages in inspectability and solder joint reliability.

Special Characteristics

■

ESD(HBM):

Latch-up current:

±2000V

±100mA

Features



AEC-Q100 Qualified ^(Note)

Integrated RAM for Display Data (DDRAM):

36 x 4 bit (Max 144 Segment)

LCD Drive Output:

Package

W (Typ.) x D (Typ.) x H (Max.)



4 Common Output, Max 36 Segment Output

Integrated Buffer AMP for LCD Driving

Integrated Oscillator Circuit



No External Components

Low Power Consumption Design

(Note) Grade 2

Applications



Instrument Clusters



Climate Controls

Car Audios / Radios

Metering

VQFN48FV7070

7.0mm x 7.0mm x 1.0mm



White Goods



Healthcare Products

Battery Operated Applications

etc.

Typical Application Circuit

VDD

C > 0.1uF

VDD

VLCD

COM0

COM1

COM2

COM3

SDA

SCL

Controller

Segment

LCD

SEG0

SEG1

・

OSCIN

TEST 1

TEST

Insert Capacitors

between VDD and VSS

VSS

SEG35

Internal Clock Mode

Figure 1. Typical Application Circuit

○Product structure：Silicon monolithic integrated circuit ○This product has no designed protection against radioactive rays.

www.rohm.com

TSZ02201-0P4P0D301040-1-2

21.Dec.2015 Rev.001

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