bq4010/Y/LY
www.ti.com
SLUS116A–MAY 1999–REVISED APRIL 2007
8 k × 8 NONVOLATILE SRAM (5 V, 3.3 V)
FEATURES
GENERAL DESCRIPTION
•
•
•
•
Data Retention for at least 10 Years Without
Power
The CMOS bq4010/Y/LY is a nonvolatile 65,536-bit
static RAM organized as 8,192 words by 8 bits. The
integral control circuitry and lithium energy source
provide reliable nonvolatility coupled with the
unlimited write cycles of standard SRAM.
Automatic Write-Protection During
Power-up/Power-down Cycles
Conventional SRAM Operation, Including
Unlimited Write Cycles
The control circuitry constantly monitors the single
supply for an out-of-tolerance condition. When VCC
falls out of tolerance, the SRAM is unconditionally
write-protected to prevent an inadvertent write
operation.
Internal Isolation of Battery before Power
Application
•
•
5-V or 3.3-V Operation
Industry Standard 28-Pin DIP Pinout or
34-Pin LIFETIME LITHIUM™ SMD Pinout
At this time the integral energy source is switched on
to sustain the memory until after VCC returns valid.
•
Snap-on, Replaceable Lithium Battery
for SMD Device
(Device Number: bq401BATCAP)
The bq4010/Y/LY uses extremely low standby
current CMOS SRAMs, coupled with small lithium
coin cells to provide nonvolatility without long
write-cycle times and the write-cycle limitations
associated with EEPROM.
The bq4010/Y/LY requires no external circuitry and is
compatible with the industry-standard 64-Mb SRAM
pinout.
PIN CONNECTIONS
34−Pin
Lifetime Lithium Module
(TOP VIEW)
28−Pin DIP Module
(TOP VIEW)
34
33
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
NC/BW
NC
NC
NC
NC
NC
1
NC
1
28
27
26
25
24
23
22
21
20
19
18
17
16
15
V
CC
2
A
12
2
WE
NC
NC
3
A
7
3
NC/RST
4
A
6
4
A
8
V
CC
A
12
5
A
5
5
A
9
WE
OE
CE
A
11
6
A
4
A
10
7
6
A
11
A
9
8
A
3
7
OE
DQ
7
A
8
9
A
2
8
A
10
DQ
6
A
7
10
11
12
13
14
15
16
17
A
1
9
CE
DQ
DQ
5
A
6
A
0
10
11
12
13
14
7
DQ
4
A
5
DQ
DQ
DQ
DQ
DQ
0
6
5
4
3
DQ
3
A
4
DQ
1
DQ
2
A
3
DQ
2
DQ
1
A
2
V
SS
DQ
0
A
1
V
SS
A
0
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1999–2007, Texas Instruments Incorporated