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AUIRF2807 PDF预览

AUIRF2807

更新时间: 2024-11-30 12:52:55
品牌 Logo 应用领域
英飞凌 - INFINEON 晶体晶体管功率场效应晶体管开关脉冲局域网
页数 文件大小 规格书
11页 202K
描述
Advanced Planar Technology, Low On-Resistance

AUIRF2807 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:ROHS COMPLIANT, PLASTIC PACKAGE-3Reach Compliance Code:compliant
ECCN代码:EAR99Factory Lead Time:55 weeks
风险等级:7.65Is Samacsys:N
其他特性:AVALANCHE RATED, HIGH RELIABILITY雪崩能效等级(Eas):340 mJ
外壳连接:DRAIN配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:75 V最大漏极电流 (Abs) (ID):75 A
最大漏极电流 (ID):75 A最大漏源导通电阻:0.013 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJEDEC-95代码:TO-220AB
JESD-30 代码:R-PSFM-T3元件数量:1
端子数量:3工作模式:ENHANCEMENT MODE
最高工作温度:175 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:FLANGE MOUNT
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:N-CHANNEL
最大功率耗散 (Abs):230 W最大脉冲漏极电流 (IDM):280 A
认证状态:Not Qualified子类别:FET General Purpose Power
表面贴装:NO端子形式:THROUGH-HOLE
端子位置:SINGLE处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

AUIRF2807 数据手册

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PD - 96384A  
AUIRF2807  
AUTOMOTIVE GRADE  
HEXFET® Power MOSFET  
Features  
V(BR)DSS  
75V  
l
AdvancedPlanarTechnology  
LowOn-Resistance  
D
S
l
l
l
l
l
l
l
l
Dynamic dV/dT Rating  
175°COperatingTemperature  
Fast Switching  
RDS(on) max.  
13m  
82A  
Ω
G
ID(Silicon Limited)  
Fully Avalanche Rated  
Repetitive Avalanche Allowed up to Tjmax  
Lead-Free,RoHSCompliant  
ID (Package Limited)  
75A  
Automotive Qualified *  
D
Description  
Specifically designed for Automotive applications, this  
Stripe Planar design of HEXFET® Power MOSFETs  
utilizes the latest processing techniques to achieve low  
on-resistancepersiliconarea.Thisbenefitcombinedwith  
the fast switching speed and ruggedized device design  
that HEXFET power MOSFETs are well known for, pro-  
videsthedesignerwithanextremelyefficientandreliable  
device for use in Automotive and a wide variety of other  
applications.  
S
D
G
TO-220AB  
AUIRF2807  
G
Gate  
D
Drain  
S
Source  
Absolute Maximum Ratings  
StressesbeyondthoselistedunderAbsoluteMaximumRatingsmaycausepermanentdamagetothedevice.These  
are stress ratings only; and functional operation of the device at these or any other condition beyond those indicated  
in the specifications is not implied.Exposure to absolute-maximum-rated conditions for extended periods may affect  
device reliability. The thermal resistance and power dissipation ratings are measured under board mounted and still  
air conditions. Ambient temperature (TA) is 25°C, unless otherwise specified.  
Parameter  
Continuous Drain Current, VGS @ 10V (Silicon Limited)  
Continuous Drain Current, VGS @ 10V (Silicon Limited)  
Continuous Drain Current, VGS @ 10V (Package Limited)  
Pulsed Drain Current  
Max.  
82  
Units  
I
I
I
I
@ T = 25°C  
C
D
D
D
58  
@ T = 100°C  
A
C
75  
@ T = 25°C  
C
280  
230  
1.5  
±20  
340  
43  
DM  
W
W/°C  
V
Power Dissipation  
P
@T = 25°C  
C
D
Linear Derating Factor  
V
EAS  
IAR  
Gate-to-Source Voltage  
GS  
Single Pulse Avalanche Energy  
Avalanche Current  
mJ  
A
EAR  
dv/dt  
23  
Repetitive Avalanche Energy  
mJ  
5.9  
Peak Diode Recovery dv/dt  
V/ns  
Operating Junction and  
T
T
J
-55 to + 175  
Storage Temperature Range  
°C  
STG  
300 (1.6mm from case )  
10 lbf in (1.1N m)  
Soldering Temperature, for 10 seconds  
Mounting Torque, 6-32 or M3 screw  
Thermal Resistance  
Parameter  
Typ.  
Max.  
0.65  
–––  
62  
Units  
RθJC  
RθCS  
RθJA  
Junction-to-Case  
–––  
0.50  
–––  
°C/W  
Case-to-Sink, Flat, Greased Surface  
Junction-to-Ambient  
HEXFET® is a registered trademark of International Rectifier.  
*Qualification standards can be found at http://www.irf.com/  
www.irf.com  
1
11/09/11  

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