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AN4870

更新时间: 2024-11-13 23:30:31
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The effect of temperature on thyristor performance

AN4870 数据手册

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AN4870  
Effects Of Temperature On Thyristor Performance  
Application Note  
Replaces September 2000 version, AN4870-3.0  
AN4870-3.1 July 2002  
The junction temperature ( Tj ) of a power semiconductor in any  
particular situation profoundly affects its performance and  
reliability.Duringitsworkinglifeathyristorcanexperienceawide  
range of temperatures.  
thyristor may often have to carry short circuit current for up to  
10ms. During this time Tj can rise transiently to 300 - 500˚C  
without the junction being damaged. Peak temperature lags  
peakcurrentbytypically2or3millisecondsand, althoughfalling,  
is still high at the end of the current pulse. If current is interrupted  
by a fuse, little or no reverse voltage appears across the device.  
However, the re-application of reverse voltage at such a high  
temperature can result in very high reverse recovery power  
dissipation. This escalates the junction temperture further and  
the subsequent high blocking current leads to reverse voltage  
failure by thermal runaway.  
Operatingat40˚Cisnotdamagingbutallowancemustbemade  
by the user for increased gate trigger current, latching current  
and holding current as well as slow turn-on (see application note  
AN4840 Gate Triggering and Gate Characteristics). Working in  
the range between room temperature and 125˚C gives the best  
compromise between ease of operation and operational life.  
Tj = 125˚C is chosen as the design maximum value since above  
this, blocking current starts to increase rapidly, thus degrading  
voltage rating, see fig.1.  
Limitcasesurgecurrentsaredeterminedbyexperimentalmeans  
using a 50Hz half sine of current and published in the data sheet.  
TheseITSM limitvaluesareusedtodeterminethepeaktemperature  
( Using ITSM for VR=0 ) and the temperature at the end of the  
current loop ( Using ITSM for VR = 50% VRRM ). These temperatures  
are then taken as the limit temperatures for the particular device.  
If temperatures in other applications are kept below these, then  
the condition will be safe.  
The device becomes much more susceptible to over-voltage  
transients , high dv/dt, di/dt and surge current. In the case of the  
forward blocking junction there is an increasing chance of  
forward breakover triggering. For special applications it is  
possible to select devices to operate continuously with low  
leakage at Tj = 140˚C but such devices may need to be fully  
characterised and rated on other parameters at 140˚C.  
The method of calculating overload Tj for the published ITSM  
currents and other overload conditions is discussed below.  
Many applications involve infrequent current overloads for short  
periods and it is possible to allow Tj to rise well above 125˚C in  
such situations. A typical situation is during a load short circuit  
when the device is protected by a fuse. In 50Hz circuits the  
The overload above assumed a high speed fuse or circuit  
breaker will interrupt the supply before forward blocking voltage  
appears. Some overloads require that the device survives with  
100  
80  
60  
40  
20  
0
VRRM  
VDRM  
80  
100  
120  
140  
160  
180  
200  
Thyristor junction temperature - (˚C)  
Fig.1 Thyristor de-rating curves  
1/5  
www.dynexsemi.com  

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