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AN-04

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AN-04 数据手册

SONET OC-3

JITTER MEASUREMENT

APPLICATION NOTE

AN-04

JITTER GENERATION

Jitter Generation Definition

Jitter Generation Requirement

Bellcore TR-NWT-000499 (Issue 4), section 7.3.3 "Jitter

generation is the process whereby jitter appears at the

output port of an individual unit of digital equipment in the

absence of applied input jitter."

Bellcore TA-NWT-000253 (Issue 2), section 5.6.5.2 "For

Category II interfaces, jitter generation shall not exceed 0.01

UI rms. For OC-N and STSX-N interfaces, a high-pass

measurement filter with a 12KHz cutoff frequency shall be

used." The low-pass cutoff frequency of the measurement

filter shall be higher than 5MHz.

The characteristic of the measurement filter is shown in

Figure 1.

SONET OC-3 Category II Jitter Generation Measurement

Filter Characteristics

UI (rms)

0.01

+20dB/decade

5MHz

(minimum)

12kHz

Frequency

Figure 1

Rev.: C

Amendment:/0

Issue Date: June, 1998

12 3 4

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型号	品牌	获取价格	描述	数据表
AN04-005	LINEAGEPOWER	获取价格	Margining and Voltage Programming
AN04-006	LINEAGEPOWER	获取价格	PWB Layout Considerations
AN0416NA	MICROCHIP	获取价格	TRANSISTOR,MOSFET,ARRAY,N-CHANNEL,160V V(BR)DSS,30MA I(D),DIP
AN0416ND	MICROCHIP	获取价格	TRANSISTOR,MOSFET,ARRAY,N-CHANNEL,160V V(BR)DSS,25MA I(D),CHIP / DIE
AN0416WG	MICROCHIP	获取价格	TRANSISTOR,MOSFET,ARRAY,N-CHANNEL,160V V(BR)DSS,30MA I(D),SO
AN0420NA	MICROCHIP	获取价格	TRANSISTOR,MOSFET,ARRAY,N-CHANNEL,200V V(BR)DSS,30MA I(D),DIP
AN0420ND	MICROCHIP	获取价格	TRANSISTOR,MOSFET,ARRAY,N-CHANNEL,200V V(BR)DSS,25MA I(D),CHIP / DIE
AN0430NA	MICROCHIP	获取价格	TRANSISTOR,MOSFET,ARRAY,N-CHANNEL,300V V(BR)DSS,30MA I(D),DIP
AN0430ND	MICROCHIP	获取价格	TRANSISTOR,MOSFET,ARRAY,N-CHANNEL,300V V(BR)DSS,25MA I(D),CHIP / DIE
AN0432NA	MICROCHIP	获取价格	TRANSISTOR,MOSFET,ARRAY,N-CHANNEL,320V V(BR)DSS,30MA I(D),DIP