AGR21125E
125 W, 2.110 GHz—2.170 GHz, N-Channel E-Mode, Lateral MOSFET
Table 1. Thermal Characteristics
Introduction
Parameter
Sym
Value
Unit
The AGR21125E is a high-voltage, gold-metalized,
enhancement mode, laterally diffused metal oxide
semiconductor (LDMOS) RF power transistor suit-
able for wideband code division multiple access
(W-CDMA), single and multicarrier class AB wireless
base station power amplifier applications.
Thermal Resistance,
Junction to Case:
AGR21125EU
Rı JC
Rı JC
0.5
0.5
°C/W
°C/W
AGR21125EF
Table 2. Absolute Maximum Ratings*
Parameter
Drain-source Voltage
Gate-source Voltage
Sym Value Unit
65 Vdc
VGS –0.5, +15 Vdc
VDSS
Total Dissipation at TC = 25 °C:
AGR21125EU
AGR21125EU (unflanged)
AGR21125EF (flanged)
PD
PD
350
350
W
W
AGR21125EF
Derate Above 25 ˇC:
AGR21125EU
AGR21125EF
Operating Junction Tempera-
ture
Figure 1. Available Packages
—
—
TJ
2.0
2.0
200
W/°C
W/°C
°C
Features
Typical performance for two carrier 3GPP
W-CDMA systems. F1 = 2135 MHz and
F2 = 2145 MHz with 3.84 MHz channel BW, adja-
cent channel BW = 3.84 MHz at F1 – 5 MHz and
F2 + 5 MHz. Third-order distortion is measured
over 3.84 MHz BW at F1 – 10 MHz and
F2 + 10 MHz. Typical P/A ratio of 8.5 dB at 0.01%
(probability) CCDF:
Storage Temperature Range
TSTG –65, +150 °C
* Stresses in excess of the absolute maximum ratings can cause
permanent damage to the device. These are absolute stress rat-
ings only. Functional operation of the device is not implied at
these or any other conditions in excess of those given in the
operational sections of the data sheet. Exposure to absolute
maximum ratings for extended periods can adversely affect
device reliability.
Table 3. ESD Rating*
— Output power: 28 W.
— Power gain: 14 dB.
— Efficiency: 27%.
— IM3: –34.5 dBc.
— ACPR: –38 dBc.
AGR21125E
HBM
Minimum (V)
Class
1B
A
500
50
MM
— Return loss: –10 dB.
CDM
1500
4
High-reliability, gold-metalization process.
Low hot carrier injection (HCI) induced bias drift
over 20 years.
* Although electrostatic discharge (ESD) protection circuitry has
been designed into this device, proper precautions must be
taken to avoid exposure to ESD and electrical overstress (EOS)
PEAK Devices
during all handling, assembly, and test operations. Agere
employs a human-body model (HBM), a machine model (MM),
and a charged-device model (CDM) qualification requirement in
order to determine ESD-susceptibility limits and protection
design evaluation. ESD voltage thresholds are dependent on the
circuit parameters used in each of the models, as defined by
JEDEC's JESD22-A114B (HBM), JESD22-A115A (MM), and
JESD22-C101A (CDM) standards.
Internally matched.
High gain, efficiency, and linearity.
Integrated ESD protection.
Device can withstand a 10:1 voltage standing wave
ratio (VSWR) at 28 Vdc, 2140 MHz, 125 W contin-
uous wave (CW) output power.
Caution: MOS devices are susceptible to damage from elec-
trostatic charge. Reasonable precautions in han-
dling and packaging MOS devices should be
observed.
Large signal impedance parameters available.