Arbitrary Function Generators
AFG31000 Series Datasheet
Key features
™
Patented InstaView technology enables engineers to see the actual
waveform at the Device Under Test (DUT) in real time, without the
need of an oscilloscope and probe, eliminating the uncertainty caused
by mismatched impedance
Sequencing option adds the ability to program long, complex
waveforms with up to 256 steps
The 9-inch capacitive touch screen works like a smart phone and has
short-cuts to frequently used settings
Built-in ArbBuilder lets you create and edit arbitrary waveforms on the
instrument, eliminating the need to connect to a PC
The Tektronix AFG31000 Series is a high-performance AFG with built-in
arbitrary waveform generation, real-time waveform monitoring, and the
largest touchscreen on the market. Providing advanced waveform
generation and programming capabilities, waveform verification, and a
modern touch-screen interface, the new AFG31000 is sure to delight and
simplify the job of every researcher and engineer.
Outputs are protected from over voltage and current to minimize
potential instrument damage
Built-in Double Pulse Test application to generate voltage pulses with
varying pulse widths onto the DUTs
Applications
Key performance specifications
1 or 2 channel models
Advanced research
Clock and system synchronization
Replication of real world signals
Component and circuit characterization and validation
Embedded circuit design and test
General purpose signal generation
Double pulse test
Output amplitude range 1 mVP-P to 10 VP-P into 50 Ω loads
Basic (AFG) mode:
25 MHz, 50 MHz, 100 MHz, 150 MHz, or 250 MHz sine waveforms
250 MSa/s, 1 GSa/s or 2 GSa/s sample rates
14-bit vertical resolution
Built-in waveforms include sine, square, ramp, pulse, noise, and
other frequently used waveforms
Sweep, Burst, and Modulation modes (AM, FM, PM, FSK, and
PWM)
Advanced (Sequence) mode:
Continuous mode (optional Sequence, Triggered and Gated
modes)
16 Mpts arbitrary waveform memory on each channel (128 Mpts
optional)
Up to 256 steps in sequence mode with loop, jump and wait events
Variable sampling clock 1 µSa/s to 2 GSa/s
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