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AFE5805ZCF

更新时间： 2024-09-18 06:36:35
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德州仪器 - TI /
页数 文件大小 规格书
52页 831K
描述
FULLY-INTEGRATED,8-CHANNEL ANALOG FRONT-END FOR ULTRASOUND 0.85nV/√Hz, 12-Bit, 50MSPS, 122mW/Channel

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AFE5805ZCF 技术参数

是否无铅： 不含铅是否Rohs认证： 符合
生命周期：Active零件包装代码：BGA
包装说明：BGA,针数：135
Reach Compliance Code：compliantECCN代码：EAR99
HTS代码：8542.39.00.01Factory Lead Time：1 week
风险等级：1.53模拟集成电路 - 其他类型：ANALOG CIRCUIT
JESD-30 代码：R-PBGA-B135JESD-609代码：e1
长度：9 mm湿度敏感等级：3
信道数量：8功能数量：1
端子数量：135最高工作温度：70 °C
最低工作温度：封装主体材料：PLASTIC/EPOXY
封装代码：BGA封装形状：RECTANGULAR
封装形式：GRID ARRAY峰值回流温度（摄氏度）：260
认证状态：Not Qualified座面最大高度：1.26 mm
最大供电电压 (Vsup)：3.47 V最小供电电压 (Vsup)：3.15 V
标称供电电压 (Vsup)：3.3 V表面贴装：YES
温度等级：COMMERCIAL端子面层：Tin/Silver/Copper (Sn/Ag/Cu)
端子形式：BALL端子节距：1 mm
端子位置：BOTTOM处于峰值回流温度下的最长时间：NOT SPECIFIED
宽度：15 mmBase Number Matches：1

AFE5805ZCF 数据手册

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AFE5805  
www.ti.com  
SBOS421D –MARCH 2008–REVISED MARCH 2010  
FULLY-INTEGRATED, 8-CHANNEL ANALOG FRONT-END FOR ULTRASOUND  
0.85nV/√Hz, 12-Bit, 50MSPS, 122mW/Channel  
Check for Samples: AFE5805  
1
FEATURES  
DESCRIPTION  
23  
•
8-Channel Complete Analog Front-End:  
LNA, VCA, PGA, LPF, and ADC  
Ultra-Low, Full-Channel Noise:  
The AFE5805 is a complete analog front-end device  
specifically designed for ultrasound systems that  
require low power and small size.  
–
•
•
•
The AFE5805 consists of eight channels, including a  
–
–
0.85nV/√Hz (TGC)  
1.1nV/√Hz (CW)  
low-noise  
attenuator (VCA), programmable gain amplifier  
(PGA), low-pass filter (LPF), and 12-bit  
amplifier  
(LNA),  
voltage-controlled  
Low Power:  
a
analog-to-digital converter (ADC) with low voltage  
differential signaling (LVDS) data outputs.  
–
–
122mW/Channel (40MSPS)  
74mW/Channel (CW Mode)  
The LNA gain is set for 20dB gain, and has excellent  
noise and signal handling capabilities, including fast  
overload recovery. VCA gain can vary over a 46dB  
range with a 0V to 1.2V control voltage common to all  
channels of the AFE5805.  
Low-Noise Pre-Amp (LNA):  
–
–
–
0.75nV/√Hz  
20dB Fixed Gain  
250mVPP Linear Input Range  
•
Variable-Gain Amplifier:  
Gain Control Range: 46dB  
The PGA can be programmed for gains of 20dB,  
25dB, 27dB, and 30dB. The internal low-pass filter  
can also be programmed to 10MHz or 15MHz.  
–
•
•
PGA Gain Settings: 20dB, 25dB, 27dB, 30dB  
Low-Pass Filter:  
The LVDS outputs of the ADC reduce the number of  
interface lines to an ASIC or FPGA, thereby enabling  
the high system integration densities desired for  
portable systems. The ADC can either be operated  
with internal or external references. The ADC also  
features a signal-to-noise ratio (SNR) enhancement  
mode that can be useful at high gains.  
–
–
Selectable BW: 10MHz, 15MHz  
2nd-Order  
•
•
•
•
•
•
Gain Error: ±0.5dB  
Channel Matching: ±0.25dB  
Distortion, HD2: –65dBFS at 5MHz  
Clamping Control  
The AFE5805 is available in a 15mm × 9mm,  
135-ball  
BGA  
package  
that  
is  
Pb-free  
Fast Overload Recovery: Two Clock Cycles  
12-Bit Analog-to-Digital Converter:  
(RoHS-compliant) and green. It is specified for  
operation from 0°C to +70°C.  
–
–
–
10MSPS to 50MSPS  
69.5dB SNR at 10MHz  
Serial LVDS Interface  
Logic/Controls  
SPI  
LVDS  
OUT  
•
•
Integrated CW Switch Matrix  
IN1  
Clamp  
and  
LPF  
.
.
.
.
12-Bit  
ADC  
15mm × 9mm, 135-BGA Package:  
8 Channels  
LNA  
VCA/PGA  
CH1  
.
.
CH8  
IN8  
–
Pb-Free (RoHS-Compliant) and Green  
Reference  
APPLICATIONS  
CW Switch Matrix (8 ´ 10)  
•
Medical Imaging, Ultrasound  
AFE5805  
IOUT (10)  
–
Portable Systems  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
3
Infineon is a registered trademark of Infineon Technologies.  
All other trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2008–2010, Texas Instruments Incorporated  
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