Datasheet > ADS801

ADS801

更新时间： 2024-11-22 02:58:39

品牌	Logo	应用领域
德州仪器 - TI		/
页数	文件大小	规格书
19页	395K
描述
ANALOG-TO-DIGITAL CONVERTER

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ADS801 数据手册

ADS801

SBAS036B – MAY 1995 – REVISED FEBRUARY 2005

12-Bit, 25MHz Sampling

ANALOG-TO-DIGITAL CONVERTER

DESCRIPTION

FEATURES

● NO MISSING CODES

The ADS801 is a low-power, monolithic 12-bit, 25MHz Ana-

log-to-Digital (A/D) converter utilizing a small geometry CMOS

process. This complete converter includes a 12-bit quantizer,

wideband track-and-hold, reference, and three-state outputs.

It operates from a single +5V power supply and can be

configured to accept either single-ended or differential input

signals.

● LOW POWER: 270mW

● INTERNAL REFERENCE

● WIDEBAND TRACK-AND-HOLD: 65MHz

● SINGLE +5V SUPPLY

The ADS801 employs digital error correction to provide

excellent Nyquist differential linearity performance for de-

manding imaging applications. Its low distortion, high SNR,

and high oversampling capability give it the extra margin

needed for telecommunications, instrumentation, and video

applications.

APPLICATIONS

● IF AND BASEBAND DIGITIZATION

● DIGITAL COMMUNICATIONS

● TEST INSTRUMENTATION

● CCD IMAGING

Copiers

This high-performance A/D converter is specified over tem-

perature for AC and DC performance at a 25MHz sampling

rate. The ADS820 is available in an SO-28 package.

Scanners

Cameras

● VIDEO DIGITIZING

● GAMMA CAMERAS

CLK

MSBI

Timing

Circuitry

12-Bit

Digital

Data

Pipeline

A/D

Converter

Error

Correction

Logic

3-State

Outputs

T/H

+3.25V

REFT

REFB

+1.25V

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

All trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

www.ti.com

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