ADS800U

更新时间： 2024-11-20 21:54:19

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BB		转换器
页数	文件大小	规格书
17页	367K
描述
12-Bit, 40MHz Sampling ANALOG-TO-DIGITAL CONVERTER

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ADS800U 数据手册

ADS800

SBAS035B – FEBRUARY 1995 – REVISED FEBRUARY 2005

12-Bit, 40MHz Sampling

ANALOG-TO-DIGITAL CONVERTER

DESCRIPTION

FEATURES

The ADS800 is a low-power, monolithic 12-bit, 40MHz Ana-

log-to-Digital (A/D) converter utilizing a small geometry CMOS

process. This complete converter includes a 12-bit quantizer,

wideband track-and-hold, reference, and three-state outputs.

It operates from a single +5V power supply and can be

configured to accept either differential or single-ended input

signals.

ꢀ LOW POWER: 390mW

ꢀ INTERNAL REFERENCE

ꢀ WIDEBAND TRACK-AND-HOLD: 65MHz

ꢀ SINGLE +5V SUPPLY

APPLICATIONS

The ADS800 employs digital error correction to provide

excellent Nyquist differential linearity performance for de-

manding imaging applications. Its low distortion, high SNR,

and high oversampling capability give it the extra margin

needed for telecommunications, test instrumentation, and

video applications.

ꢀ IF AND BASEBAND DIGITIZATION

ꢀ DIGITAL COMMUNICATIONS

ꢀ ULTRASOUND IMAGING

ꢀ GAMMA CAMERAS

ꢀ TEST INSTRUMENTATION

This high-performance A/D converter is specified over tem-

perature for AC and DC performance at a 40MHz sampling

rate. The ADS800 is available in an SO-28 package.

ꢀ CCD IMAGING

Copiers

Scanners

Cameras

ꢀ VIDEO DIGITIZING

CLK

MSBI

Timing

Circuitry

Pipeline

A/D

Converter

12-Bit

Digital

Data

Error

Correction

Logic

3-State

Outputs

T/H

+3.25V

REFT

REFB

+1.25V

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

All trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

www.ti.com

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