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ADS7830 PDF预览

ADS7830

更新时间: 2024-11-23 22:53:39
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页数 文件大小 规格书
16页 249K
描述
8-Bit, 8-Channel Sampling ANALOG-TO-DIGITAL CONVERTER with I2C⑩ Interface

ADS7830 数据手册

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ADS7830  
A
®
D
S
7
8
3
0
SBAS302 – DECEMBER 2003  
8-Bit, 8-Channel Sampling  
ANALOG-TO-DIGITAL CONVERTER  
with I2CInterface  
FEATURES  
APPLICATIONS  
70kHz SAMPLING RATE  
±0.5LSB INL/DNL  
8 BITS NO MISSING CODES  
4 DIFFERENTIAL/8 SINGLE-ENDED INPUTS  
2.7V TO 5V OPERATION  
VOLTAGE-SUPPLY MONITORING  
ISOLATED DATA ACQUISITION  
TRANSDUCER INTERFACE  
BATTERY-OPERATED SYSTEMS  
REMOTE DATA ACQUISITION  
BUILT-IN 2.5V REFERENCE/BUFFER  
SUPPORTS ALL THREE I2C MODES:  
DESCRIPTION  
Standard, Fast, and High-Speed  
The ADS7830 is a single-supply, low-power, 8-bit data  
acquisition device that features a serial I2C interface and an  
8-channel multiplexer. The Analog-to-Digital (A/D) converter  
features a sample-and-hold amplifier and internal,  
asynchronous clock. The combination of an I2C serial,  
2-wire interface and micropower consumption makes the  
ADS7830 ideal for applications requiring the A/D converter to  
be close to the input source in remote locations and for  
applications requiring isolation. The ADS7830 is available in  
a TSSOP-16 package.  
LOW POWER:  
180µW (Standard Mode)  
300µW (High-Speed Mode)  
675µW (Fast Mode)  
DIRECT PIN COMPATIBLE WITH ADS7828  
TSSOP-16 PACKAGE  
CH0  
CH1  
CH2  
CH3  
SAR  
8-Channel  
MUX  
CH4  
CH5  
CH6  
CH7  
COM  
SDA  
SCL  
CDAC  
Serial  
Interface  
A0  
Comparator  
A1  
S/H Amp  
2.5V VREF  
REFIN/REFOUT  
Buffer  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
All trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
Copyright © 2003, Texas Instruments Incorporated  
www.ti.com  

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