SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
HFG PACKAGE
(TOP VIEW)
D Military Operating Temperature Range:
-- 5 5 °C to 125°C
D Processed to MIL-PRF-38535
D Fast Instruction Cycle Time (30 ns and
40 ns)
1
99
67
D Source-Code Compatible With All C1x
and C2x Devices
D RAM-Based Operation
-- 9 K × 16-Bit Single-Cycle On-Chip
Program/Data RAM
-- 1056 × 16-Bit Dual-Access On-Chip
Data RAM
33
D 2K × 16-Bit On-Chip Boot ROM
D 224K × 16-Bit Maximum Addressable
External Memory Space (64K Program,
64K Data, 64K I/O, and 32K Global)
GFA PACKAGE
(TOP VIEW)
D 32-Bit Arithmetic Logic Unit (ALU)
-- 32-bit Accumulator (ACC)
A
C
B
-- 32-Bit Accumulator Buffer (ACCB)
D
F
E
G
J
D 16-Bit Parallel Logic Unit (PLU)
D 16 × 16-Bit Multiplier, 32-Bit Product
D 11 Context-Switch Registers
H
K
L
M
P
T
D Two Buffers for Circular Addressing
D Full-Duplex Synchronous Serial Port
D Time-Division Multiplexed Serial Port (TDM)
D Timer With Control and Counter Registers
N
R
U
W
V
2
4
6
8 10 12 14 16 18
7 9 11 13 15 17 19
1
3
5
D 16 Software Programmable Wait-State
Generators
PQ PACKAGE
(TOP VIEW)
D Divide-by-One Clock Option
D IEEE 1149.1† Boundary Scan Logic
D Operations Are Fully Static
1 132
117
17
18
116
D Enhanced Performance Implanted CMOS
(EPIC™) Technology Fabricated by Texas
Instruments
D Packaging
-- 141-Pin Ceramic Grid Array (GFA Suffix)
-- 132-Lead Ceramic Quad Flat Package
(HFG Suffix)
-- 132-Lead Plastic Quad Flat Package
(PQ Suffix)
84
50
51
83
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
†
IEEE Standard 1149.1-1990 Standard-Test-Access Port and Boundary Scan Architecture
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1998, Texas Instruments Incorporated
On products compliant to MIL-STD-883, Class B, all parameters are
tested unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
1
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