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192681-1R5 PDF预览

192681-1R5

更新时间: 2022-12-18 07:04:35
品牌 Logo 应用领域
美国国家仪器公司 - NI /
页数 文件大小 规格书
6页 548K
描述
100 and 50 MHz, Programmable-VoltageDigital Waveform Generator/Analyzers

192681-1R5 数据手册

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100 and 50 MHz, Programmable-Voltage  
Digital Waveform Generator/Analyzers  
NI 655x  
• 100 MHz maximum clock rate  
Operating Systems  
• Windows 2000/NT/XP  
• LabVIEW Real-Time  
• -2.0 to 5.5 V programmable voltage  
levels in 10 mV steps  
• 20 channels with per-channel, per-cycle  
bidirectional control  
• 1, 8, or 64 Mb/channel onboard memory  
• Real-time hardware comparison of  
acquired data  
Recommended Software  
• LabVIEW  
• LabWindows/CVI  
• SignalExpress  
• Complex triggering and pattern  
sequencing  
• Interactive waveform and script  
editor software  
• Synchronization and Memory Core  
(SMC) for tight synchronization with  
other SMC-based devices  
Driver and Editing Software  
(included)  
• NI-HSDIO driver  
• Script Editor  
• Digital Waveform Editor  
(included with 8 and  
64 Mb/channel models)  
Calibration  
• NIST traceable  
• 2-year external calibration cycle  
Maximum Clock  
Rate (MHz)  
Memory  
(Mb/channel) (Linking/Looping)  
Scripting  
Programmable Per-Cycle  
Hardware  
Comparison  
Product Platform  
Channels  
Voltage Levels  
Data Delay  
Tristate  
NI 6552  
NI 6551  
PCI, PXI  
PCI, PXI  
20  
20  
100  
50  
Programmable, 10 mV steps  
Programmable, 10 mV steps  
1, 8, or 64  
1, 8, or 64  
Table 1. NI 655x Selection Guide  
Overview  
Design High-Performance Tests  
For building high-performance stimulus-response systems, the NI 655x  
The National Instruments 6552 and  
6551 are 100 and 50 MHz digital  
waveform generator/analyzers,  
respectively, for characterizing,  
validating, and testing digital  
Applications  
Semiconductor  
devices include:  
• A sophisticated timing engine to adjust for the timing parameters  
of the device under test  
Mixed-signal design validation and test  
Interfacing to digital electronics  
Aerospace/Defense  
Subsystem emulation  
• Programmable voltage levels for testing multiple devices or  
characterizing a single device under changing conditions  
• Per-cycle tristate for bidirectional communication  
• A versatile memory architecture for maximum flexibility of waveform  
and scripting memory  
Bit error rate tester (BERT)  
electronics. These modules feature  
20 channels with per-channel,  
Communications  
Multimedia chipset emulation  
per-cycle direction control and deep  
onboard memory with triggering and  
pattern sequencing. You can program  
the voltage levels on NI 655x devices  
Consumer Electronics  
CMOS and CCD imaging sensors  
Digital display tests  
The hardware architecture is designed to preserve high signal quality,  
and an eye diagram of the PXI-6552 generation is shown in Figure 1.  
You can use the internal clock or an external clock, such as from the  
NI PXI-5404, through the front panel. You can also shift the data  
generated, data acquired, and exported sample clock relative to the  
onboard clock for clock frequencies above 25 MHz, which is critical to  
adjust for propagation delays and setup-and-hold times in the device  
under test.  
with 10 mV resolution. You can use them with the NI Digital Waveform  
Editor, an interactive software tool for creating, editing, and importing  
digital waveforms. With the SMC, you can create mixed-signal test  
systems with digitizers, arbitrary waveform generators, and other digital  
waveform generator/analyzers, or you can synchronize multiple digital  
waveform devices to build high-channel-count test systems.  
Programmable voltage levels are needed when testing different  
devices or when characterizing how a given device performs under  
changing conditions. With NI 655x devices, the high and low levels for  

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