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89C1632RPQE-30 PDF预览

89C1632RPQE-30

更新时间: 2024-01-31 07:35:41
品牌 Logo 应用领域
麦斯威 - MAXWELL 静态存储器
页数 文件大小 规格书
13页 200K
描述
16 Megabit (512K x 32-Bit) MCM SRAM

89C1632RPQE-30 技术参数

生命周期:Obsolete零件包装代码:QFP
包装说明:GQFF,针数:68
Reach Compliance Code:unknownECCN代码:3A001.A.2.C
HTS代码:8542.32.00.41风险等级:5.84
最长访问时间:30 nsJESD-30 代码:S-CQFP-F68
长度:37.9476 mm内存密度:16777216 bit
内存集成电路类型:SRAM MODULE内存宽度:32
功能数量:1端子数量:68
字数:524288 words字数代码:512000
工作模式:ASYNCHRONOUS最高工作温度:125 °C
最低工作温度:-55 °C组织:512KX32
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:GQFF
封装形状:SQUARE封装形式:FLATPACK, GUARD RING
并行/串行:PARALLEL认证状态:Not Qualified
座面最大高度:6.1976 mm最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子形式:FLAT
端子节距:1.27 mm端子位置:QUAD
总剂量:100k Rad(Si) V宽度:37.9476 mm
Base Number Matches:1

89C1632RPQE-30 数据手册

 浏览型号89C1632RPQE-30的Datasheet PDF文件第2页浏览型号89C1632RPQE-30的Datasheet PDF文件第3页浏览型号89C1632RPQE-30的Datasheet PDF文件第4页浏览型号89C1632RPQE-30的Datasheet PDF文件第5页浏览型号89C1632RPQE-30的Datasheet PDF文件第6页浏览型号89C1632RPQE-30的Datasheet PDF文件第7页 
89C1632  
16 Megabit (512K x 32-Bit)  
MCM SRAM  
16 Megabit (512k x 32-bit) SRAM MCM  
CS 1-4  
Address  
OE, WE  
Power  
Ground  
4Mb SRAM  
4Mb SRAM  
4Mb SRAM  
4Mb SRAM  
MCM  
I/O 0-7  
I/O 8-15  
I/O 16-23  
I/O 24-31  
Logic Diagram  
FEATURES:  
DESCRIPTION:  
• Four 512k x 8 SRAM architecture  
• RAD-PAK® technology hardens against natural space radia-  
tion technology  
Maxwell Technologies’ 89C1632 high-performance 16 Mega-  
bit Multi-Chip Module (MCM) Static Random Access Memory  
features a greater than 100 krad (Si) total dose tolerance,  
depending upon space mission. The four 4-Megabit SRAM die  
and bypass capacitors are incorporated into a high-reliable  
hermetic quad flat-pack ceramic package. With high-perfor-  
mance silicon-gate CMOS technology, the 89C1632 reduces  
power consumption and eliminates the need for external  
clocks or timing strobes. It is equipped with output enable  
(OE) and four byte enable (CS1 - CS4) inputs to allow greater  
system flexibility. When OE input is high, the output is forced  
to high impedance.  
Total dose hardness:  
- > 100 krad (Si), depending upon space mission  
• Excellent Single Event Effects:  
- SEL > 101MeV-cm2/mg  
- SEU threshold = 3 MeV-cm2/mg  
- SEU saturated cross section: 6E-9 cm2/bit  
• Package: 68-pin quad flat package  
• Fast access time: 20, 25 and 30 ns  
• Completely static memory - no clock or timing strobe  
required  
Internal bypass capacitor  
Maxwell Technologies' patented RAD-PAK® packaging technol-  
ogy incorporates radiation shielding in the microcircuit pack-  
age. In a GEO orbit, RAD-PAK provides true greater than 100  
krad (Si) total radiation dose tolerance, dependent upon space  
mission. It eliminates the need for box shielding while provid-  
ing the required radiation shielding for a lifetime in orbit or a  
space mission. This product is available with screening up to  
Maxwell Technologies self-defined Class K.  
High-speed silicon-gate CMOS technology  
• 5V or 3V ± 10% power supply  
• Equal address and chip enable access times  
Three-state outputs  
All inputs and outputs are TTL compatible  
01.10.05 Rev 3  
1
All data sheets are subject to change without notice  
(619) 503-3300 - Fax: (619) 503-3301 - www.maxwell.com  
©2005 Maxwell Technologies.  
All rights reserved.  

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