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AFBR-79E4Z-D PDF预览

AFBR-79E4Z-D

更新时间: 2024-02-06 23:15:27
品牌 Logo 应用领域
安华高科 - AVAGO 光纤通信
页数 文件大小 规格书
2页 160K
描述
4 Channels Quad Small Form Factor Pluggable Parallel Optics Transceiver

AFBR-79E4Z-D 技术参数

是否Rohs认证: 符合生命周期:Obsolete
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8517.62.00.50风险等级:5.82
Is Samacsys:N主体宽度:18.35 mm
主体高度:8.5 mm主体长度或直径:71 mm
通信标准:GBE连接类型:MTP CONNECTOR
数据速率(接收):10312.5 Mbps数据速率(发送):10312.5 Mbps
发射极/检测器类型:LASER, PIN PHOTODIODE光纤设备类型:TRANSCEIVER
安装特点:SURFACE MOUNT最高工作温度:70 °C
最低工作温度:最大工作波长:860 nm
最小工作波长:840 nm标称工作波长:850 nm
子类别:Fiber Optic Transceivers最大供电电压:3.465 V
最小供电电压:3.135 V标称供电电压:3.3 V
表面贴装:YESBase Number Matches:1

AFBR-79E4Z-D 数据手册

 浏览型号AFBR-79E4Z-D的Datasheet PDF文件第2页 
AFBR-79E4Z-D  
4 Channels Quad Small Form Factor  
Pluggable Parallel Optics Transceiver  
Reliability Data Sheet  
Description  
FIT Prediction Based on Telcordia SR-332 Parts Count  
Procedure  
The Avago Technologies AFBR-79E4Z-D are 10G, 4 chan-  
nel Quad Small Form Factor, Pluggable Parallel Optics  
Transceiver, utilizing Avago’s 850nm VCSEL.  
The Telcordia parts count method assumes that the mod-  
ule failure rate is equal to the sum of the device compo-  
nent failure rates. Modifiers are included to take into con-  
sideration variations in module operation environments,  
device quality requirements, temperature, and stress. The  
tables that follow show the FIT for the components used  
in the modules and the total FIT which have been calcu-  
lated for an operating ambient temperature of 40oC.  
FIT Rate Summary  
FIT rate for AFBR-79E4Z-D is calculated as 197.42. Compu-  
tation was done at 40°C based on Telcordia SR- 332 (Issue  
2), Part Count Method. The details of the calculation are  
included in this report.  
Random Failure Rate (FIT) Calculation  
Random Failure Rate (FIT) Calculation  
Failure in time rate, or FIT, is defined as the number of  
failures per billion device hours. In the product useful life  
region, the random failure rate is considered as a constant  
failure rate. In this region MTTF, Mean Time to Failure, is  
defined as MTTF = 1/FIT.  
Failure in time rate, or FIT, is defined as the number of  
failures per billion device hours. In the product useful life  
region, the random failure rate is considered as a constant  
failure rate. In this region MTTF, Mean Time to Failure, is  
defined as MTTF = 1/FIT.  
FITs Prediction Based on Telcordia SR-332 Part Count Pro-  
cedure  
The Telcordia parts count method assumes that the mod-  
ule failure rate is equal to the sum of the device compo-  
nent failure rates. Modifiers are included to take into con-  
sideration variations in module operation environments,  
device quality requirements, temperature, and stress. The  
following table shows the FITs for the components used in  
the module and the total FITs which has been calculated  
for a case temperature of 40°C.  

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