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AS4LC1M16S1-8TC PDF预览

AS4LC1M16S1-8TC

更新时间: 2024-01-11 11:20:43
品牌 Logo 应用领域
ALSC 动态存储器
页数 文件大小 规格书
28页 692K
描述
3.3V 2M x 8/1M x 16 CMOS synchronous DRAM

AS4LC1M16S1-8TC 数据手册

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Advance information  
AS4LC2M8S1  
AS4LC1M16S1  
3.3V 2M × 8/ 1M × 16 CMOS synchronous DRAM  
Features  
• Organization  
- 1,048,576 words × 8 bits × 2 banks (2M × 8)  
11 row, 9 column address  
- 524,288 words × 16 bits × 2 banks (1M × 16)  
11 row,8 column address  
All signals referenced to positive edge of clock, fully  
synchronous  
Dual internal banks controlled by A11 (bank select)  
• High speed  
- 143/ 125/ 100 MHz  
- 7/ 8/ 10 ns clock access time  
Low power consumption  
- Active: 576 mW max  
- Standby: 7.2 mW max, CMOS I/ O  
• 2048 refresh cycles, 64 ms refresh interval  
Auto refresh and self refresh (2K self refresh mode at 64 ms)  
• PC100 functionality  
Automatic and direct precharge including concurrent  
autoprecharge  
Burst read, write/ Single write  
Random column address assertion in every cycle, pipelined  
operation  
LVTTL compatible I/ O  
• 3.3V power supply  
• JEDEC standard package, pinout and function  
- 400 mil, 44-pin TSOP II (2M × 8)  
- 400 mil, 50-pin TSOP II (1M × 16)  
Read/ write data masking  
• Programmable burst length (1/ 2/ 4/ 8/ full page)  
• Programmable burst sequence (sequential/ interleaved)  
• Programmable CAS latency (1/ 2/ 3)  
Pin arrangement  
Pin designation  
TSOP II  
50  
TSOP II  
Pin(s)  
Description  
V
V
SS  
V
V
SS  
1
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
1
CC  
CC  
DQ0  
DQ1  
49  
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
DQ15  
DQ14  
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
DQ0  
2
DQ7  
DQM (2M × 8)  
UDQM/ LDQM (1M × 16)  
V
V
3
SSQ  
SSQ  
Output disable/ write mask  
V
V
SSQ  
SSQ  
DQ6  
4
DQ1  
DQ13  
DQ12  
V
V
DQ2  
DQ3  
5
CCQ  
CCQ  
RA0 – 10  
Address inputs CA0 – 7 (×16)  
CA0 – 8 (×8)  
DQ2  
6
DQ5  
V
V
V
V
CCQ  
DQ4  
DQ5  
CCQ  
7
SSQ  
SSQ  
A0 to A10  
A11  
DQ11  
DQ10  
DQ3  
8
DQ4  
V
V
CCQ  
NC  
9
CCQ  
V
V
NC  
NC  
DQM  
CLK  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
SSQ  
SSQ  
DQ6  
DQ7  
DQ9  
DQ8  
NC  
WE  
CAS  
Bank address (BA)  
V
V
CCQ  
CCQ  
DQ0 to DQ7 (2M × 8)  
DQ0 to DQ15 (1M × 16)  
Input/ output  
LDQM  
NC  
UDQM  
CLK  
CKE  
NC  
A9  
A8  
A7  
A6  
A5  
RAS  
CS  
A11  
A10  
A0  
A1  
A2  
A3  
CKE  
NC  
A9  
A8  
A7  
A6  
A5  
A4  
V
SS  
WE  
CAS  
RAS  
CS  
A11  
A10  
A0  
A1  
A2  
A3  
35  
34  
33  
32  
31  
30  
29  
RAS  
CAS  
Row address strobe  
Column address strobe  
Write enable  
WE  
V
CC  
CS  
Chip select  
23  
24  
25  
28  
27  
26  
A4  
V
SS  
VCC, VCCQ  
Power (3.3V ± 0.3V)  
Ground  
V
CC  
VSS, V  
LEGEND  
2M × 8  
1M × 16  
512K × 16 × 2 banks  
2K  
2K (A0 – A10)  
2 (BA)  
SSQ  
Configuration  
Refresh Count  
Row Address  
1M × 8 × 2 banks  
2K  
2K (A0 – A10)  
2 (BA)  
CLK  
CKE  
Clock input  
Clock enable  
Bank Address  
Column Address  
512 (A0 – A8)  
256 (A0 – A7)  
Selection guide  
Symbol  
fMax  
tAC  
–7  
143  
5.5  
2
–8  
125  
6
–10  
100  
6
Unit  
MHz  
ns  
Bus frequency (CL = 3)  
Maximum clock access time (CL = 3)  
Minimum input setup time  
tS  
2
2
ns  
Minimum input hold time  
tH  
1.0  
70  
1.0  
80  
1.0  
80  
ns  
Row cycle time (CL = 3, BL = 1)  
tRC  
ns  
Maximum operating current ([×16], RD or  
WR, CL = 3), BL = 2  
ICC1  
130  
1
100  
1
100  
1
mA  
mA  
Maximum CMOS standby current, self refresh  
ICC6  
7/ 5/ 00  
ALLIANCE SEMICONDUCTOR  
1
Copyright ©2000 Alliance Semiconductor. All rights reserved.  

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