Datasheet > 逻辑 > 总线驱动器/收发器> 8V18502AIPMREP

8V18502AIPMREP

更新时间： 2024-09-30 12:50:35

品牌	Logo	应用领域
德州仪器 - TI		总线驱动器总线收发器逻辑集成电路测试
页数	文件大小	规格书
42页	935K
描述
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

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技术参数
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替代型号

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8V18502AIPMREP 技术参数

是否无铅：	含铅	是否Rohs认证：	不符合
生命周期：	Obsolete	零件包装代码：	QFP
包装说明：	LFQFP,	针数：	64
Reach Compliance Code：	not_compliant	ECCN代码：	EAR99
HTS代码：	8542.39.00.01	风险等级：	5.47
系列：	LVT	JESD-30 代码：	S-PQFP-G64
JESD-609代码：	e4	长度：	10 mm
逻辑集成电路类型：	BOUNDARY SCAN REG BUS TRANSCEIVER	湿度敏感等级：	3
位数：	9	功能数量：	2
端口数量：	2	端子数量：	64
最高工作温度：	85 °C	最低工作温度：	-40 °C
输出特性：	3-STATE	输出极性：	TRUE
封装主体材料：	PLASTIC/EPOXY	封装代码：	LFQFP
封装形状：	SQUARE	封装形式：	FLATPACK, LOW PROFILE, FINE PITCH
峰值回流温度（摄氏度）：	220	传播延迟（tpd）：	6.8 ns
认证状态：	Not Qualified	座面最大高度：	1.6 mm
最大供电电压 (Vsup)：	3.6 V	最小供电电压 (Vsup)：	2.7 V
标称供电电压 (Vsup)：	3.3 V	表面贴装：	YES
技术：	CMOS	温度等级：	INDUSTRIAL
端子面层：	Nickel/Palladium/Gold (Ni/Pd/Au)	端子形式：	GULL WING
端子节距：	0.5 mm	端子位置：	QUAD
处于峰值回流温度下的最长时间：	NOT SPECIFIED	宽度：	10 mm
Base Number Matches：	1

8V18502AIPMREP 数据手册

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SCAS744A − DECEMBER 2003 − REVISED JUNE 2004

Controlled Baseline

− One Assembly/Test Site, One Fabrication

Site

UBT  (Universal Bus Transceiver)

Combines D-Type Latches and D-Type

Flip-Flops for Operation in Transparent,

Latched, or Clocked Mode

Enhanced Diminishing Manufacturing

Sources (DMS) Support

Bus Hold on Data Inputs Eliminates the

Need for External Pullup Resistors

Enhanced Product-Change Notification

B-Port Outputs of SN74LVTH182502A

Device Have Equivalent 25-Ω Series

Resistors, So No External Resistors Are

Required

†

Qualification Pedigree

Members of the Texas Instruments

SCOPE  Family of Testability Products

Members of the Texas Instruments

Widebus Family

State-of-the-Art 3.3-V ABT Design Supports

Mixed-Mode Signal Operation (5-V Input

and Output Voltages With 3.3-V V

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

SCOPE  Instruction Set

)

− IEEE Standard 1149.1-1990 Required

Instructions and Optional CLAMP and

HIGHZ

Support Unregulated Battery Operation

Down to 2.7 V

†

Component qualification in accordance with JEDEC and industry

standards to ensure reliable operation over an extended

temperature range. This includes, but is not limited to, Highly

Accelerated Stress Test (HAST) or biased 85/85, temperature

cycle, autoclave or unbiased HAST, electromigration, bond

intermetallic life, and mold compound life. Such qualification

testing should not be viewed as justifying use of this component

beyond specified performance and environmental limits.

− Parallel-Signature Analysis at Inputs

− Pseudorandom Pattern Generation From

Outputs

− Sample Inputs/Toggle Outputs

− Binary Count From Outputs

− Device Identification

− Even-Parity Opcodes

description/ordering information

The SN74LVTH18502A and SN74LVTH182502A scan test devices, with 18-bit universal bus transceivers, are

members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports

IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan

access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

Additionally, these devices are designed specifically for low-voltage (3.3-V) V

capability to provide a TTL interface to a 5-V system environment.

operation, but with the

In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type

flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used either as two 9-bit

transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples

of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP

in the normal mode does not affect the functional operation of the SCOPE universal bus transceivers.

ORDERING INFORMATION

ORDERABLE

PART NUMBER

TOP-SIDE

MARKING

‡

PACKAGE

LQFP − PM

Tape and reel

8V18502AIPMREP

LH18502AEP

−40°C to 85°C

8V182502AIPMREP

‡

Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available

at www.ti.com/sc/package.

Product Preview

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE, Widebus, and UBT are trademarks of Texas Instruments.

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POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3 4 5 6 7...42

中文翻译

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8V18502AIPMREP 替代型号

型号	品牌	替代类型	描述	数据表
74LVTH18502APMRG4	TI	完全替代	3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN74LVTH18502APM	TI	完全替代	3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN74LVTH18502APMR	TI	完全替代	3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

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