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813N252AK-02LF PDF预览

813N252AK-02LF

更新时间: 2024-11-07 21:09:43
品牌 Logo 应用领域
艾迪悌 - IDT 时钟外围集成电路晶体
页数 文件大小 规格书
24页 331K
描述
Clock Generator, 312.5MHz, 5 X 5 MM, 0.925 MM HEIGHT, ROHS COMPLIANT, MO-220VHHD-2, VFQFN-32

813N252AK-02LF 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:QFN
包装说明:HVQCCN, LCC32,.2SQ,20针数:32
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:5.21
JESD-30 代码:S-XQCC-N32JESD-609代码:e3
长度:5 mm湿度敏感等级:3
端子数量:32最高工作温度:70 °C
最低工作温度:最大输出时钟频率:312.5 MHz
封装主体材料:UNSPECIFIED封装代码:HVQCCN
封装等效代码:LCC32,.2SQ,20封装形状:SQUARE
封装形式:CHIP CARRIER, HEAT SINK/SLUG, VERY THIN PROFILE峰值回流温度(摄氏度):260
电源:3.3 V主时钟/晶体标称频率:155.52 MHz
认证状态:Not Qualified座面最大高度:1 mm
子类别:Clock Generators最大压摆率:273 mA
最大供电电压:3.465 V最小供电电压:3.135 V
标称供电电压:3.3 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Matte Tin (Sn) - annealed端子形式:NO LEAD
端子节距:0.5 mm端子位置:QUAD
处于峰值回流温度下的最长时间:30宽度:5 mm
uPs/uCs/外围集成电路类型:CLOCK GENERATOR, OTHERBase Number Matches:1

813N252AK-02LF 数据手册

 浏览型号813N252AK-02LF的Datasheet PDF文件第2页浏览型号813N252AK-02LF的Datasheet PDF文件第3页浏览型号813N252AK-02LF的Datasheet PDF文件第4页浏览型号813N252AK-02LF的Datasheet PDF文件第5页浏览型号813N252AK-02LF的Datasheet PDF文件第6页浏览型号813N252AK-02LF的Datasheet PDF文件第7页 
®
ICS813N252-02  
Jitter Attenuator & FemtoClock NG Multiplier  
DATA SHEET  
General Description  
Features  
The ICS813N252-02 device uses IDT's fourth generation  
FemtoClock® NG technology for optimal high clock frequency and  
low phase noise performance, combined with a low power  
consumption and high power supply noise rejection. The  
ICS813N252-02 is a PLL based synchronous multiplier that is  
optimized for PDH or SONET to Ethernet clock jitter attenuation and  
frequency translation.  
Fourth generation FemtoClock® NG technology  
Two LVPECL output pairs  
Each output supports independent frequency selection at 25MHz,  
125MHz, 156.25MHz and 312.5MHz  
Two differential inputs support the following input types: LVPECL,  
LVDS, LVHSTL, SSTL, HCSL  
Accepts input frequencies from 8kHz to 155.52MHz including  
8kHz, 1.544MHz, 2.048MHz, 19.44MHz, 25MHz, 77.76MHz,  
125MHz and 155.52MHz  
The ICS813N252-02 is a fully integrated Phase Locked loop device  
utilizing a FemtoClock NG Digital VCXO that provides the low jitter,  
high frequency SONET/PDH output clock that easily meets OC-48  
jitter requirements. This VCXO technology simplifies PLL design by  
replacing the pullable crystal requirement of analog VCXOs with a  
fixed 27MHz generator crystal. Jitter attenuation down to 10Hz is  
provided by an external loop filter. Pre-divider and output divider  
multiplication ratios are selected using device selection control pins.  
The multiplication ratios are optimized to support most common  
clock rates used in PDH, SONET and Ethernet applications. The  
device requires the use of an external, inexpensive fundamental  
mode 27MHz crystal. The device is packaged in a space-saving  
32-VFQFN package and supports commercial temperature range.  
Crystal interface optimized for a 27MHz, 10pF parallel resonant  
crystal  
Attenuates the phase jitter of the input clock by using a low-cost  
fundamental mode crystal  
Customized settings for jitter attenuation and reference tracking  
using an external loop filter connection  
FemtoClock NG frequency multiplier provides low jitter, high  
frequency output  
Absolute pull range: 100ppm  
Power supply noise rejection (PSNR): -95dB (typical)  
FemtoClock NG VCXO frequency: 2500MHz  
RMS phase jitter @ 156.25MHz, using a 27MHz crystal  
(12kHz – 20MHz): 0.6ps (typical)  
Pin Assignment  
RMS phase jitter @ 125MHz, using a 27MHz crystal  
(12kHz – 20MHz): 0.63ps (typical)  
3.3V supply voltage  
0°C to 70°C ambient operating temperature  
Available in lead-free (RoHS 6) package  
32 31 30 29 28 27 26 25  
1
2
3
4
5
6
7
8
LF1  
LF0  
VEE  
24  
23  
22  
21  
20  
nQB  
QB  
ISET  
VCCO  
nQA  
VEE  
CLK_SEL  
VCC  
QA  
19  
18  
17  
RESERVED  
VEE  
VEE  
ODASEL_0  
9
10 11 12 13 14 15 16  
ICS813N252-02  
32 Lead VFQFN  
5mm x 5mm x 0.925mm package body  
K Package  
Top View  
ICS813N252AK-02 REVISION B MAY 27, 2011  
1
©2011 Integrated Device Technology, Inc.  

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