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79C0832XPQE-15 PDF预览

79C0832XPQE-15

更新时间: 2024-11-10 22:11:19
品牌 Logo 应用领域
麦斯威 - MAXWELL 可编程只读存储器电动程控只读存储器电可擦编程只读存储器
页数 文件大小 规格书
19页 478K
描述
8 Megabit (256K x 32-Bit) EEPROM MCM

79C0832XPQE-15 技术参数

生命周期:Transferred零件包装代码:QFP
包装说明:QFF, TPAK96,3SQ针数:96
Reach Compliance Code:compliantECCN代码:3A001.A.2.C
HTS代码:8542.32.00.51风险等级:5.42
最长访问时间:150 ns命令用户界面:NO
数据轮询:YESJESD-30 代码:S-XQFP-F96
长度:43.3578 mm内存密度:8388608 bit
内存集成电路类型:EEPROM MODULE内存宽度:32
功能数量:1端子数量:96
字数:262144 words字数代码:256000
工作模式:ASYNCHRONOUS最高工作温度:125 °C
最低工作温度:-55 °C组织:256KX32
封装主体材料:UNSPECIFIED封装代码:QFF
封装等效代码:TPAK96,3SQ封装形状:SQUARE
封装形式:FLATPACK页面大小:512 words
并行/串行:PARALLEL电源:5 V
编程电压:5 V认证状态:Not Qualified
就绪/忙碌:YES座面最大高度:6.223 mm
最大待机电流:0.00008 A子类别:EEPROMs
最大压摆率:0.225 mA最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子形式:FLAT
端子节距:1.27 mm端子位置:QUAD
切换位:NO宽度:43.3578 mm
最长写入周期时间 (tWC):10 msBase Number Matches:1

79C0832XPQE-15 数据手册

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79C0832  
8 Megabit (256K x 32-Bit)  
EEPROM MCM  
FEATURES:  
DESCRIPTION:  
• 256k x 32-bit EEPROM MCM  
• RAD-PAK® radiation-hardened against natural  
• space radiation  
Maxwell Technologies’ 79C0832 multi-chip module (MCM)  
memory features a greater than 100 krad (Si) total dose toler-  
ance, dependent upon orbit. Using Maxwell Technologies’ pat-  
ented radiation-hardened RAD-PAK® MCM packaging  
technology, the 79C0832 is the first radiation-hardened 8  
megabit MCM EEPROM for space application. The 79C0832  
uses eight 1 Megabit high speed CMOS die to yield an 8  
megabit product. The 79C0832 is capable of in-system electri-  
cal byte and page programmability. It has a 128 x 8 byte page  
programming function to make its erase and write operations  
faster. It also features Data Polling and a Ready/Busy signal to  
indicate the completion of erase and programming operations.  
In the 79C0832, hardware data protection is provided with the  
RES pin, in addition to noise protection on the WE signal and  
write inhibit on power on and off. Software data protection is  
implemented using the JEDEC optional standard algorithm.  
Total dose hardness:  
- >100 krad (Si)  
- Dependent upon orbit  
• Excellent Single event effects  
- SEL > 120 MeV/mg/cm2  
TH  
- SEU > 90 MeV/mg/cm2 read mode  
- SEU = 18 MeV/mg/cm2 write mode  
High endurance  
- 10,000 cycles/byte (Page Programming Mode)  
- 10 year data retention  
• Page Write Mode: 1 to 8 X 128 byte page  
High Speed:  
- 150 and 200 ns maximum access times  
Automatic programming  
- 10 ms automatic Page/Byte write  
Low power dissipation  
Maxwell Technologies' patented RAD-PAK® packaging technol-  
ogy incorporates radiation shielding in the microcircuit pack-  
age. It eliminates the need for box shielding while providing  
the required radiation shielding for a lifetime in orbit or space  
mission. In a GEO orbit, RAD-PAK provides greater than 100  
krad (Si) radiation dose tolerance. This product is available  
with screening up to Maxwell Technologies self-defined Class  
K.  
- 160 mW/MHz active current  
- 880 µW standby current  
01.10.05 Rev 14  
1
All data sheets are subject to change without notice  
(858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com  
©2005 Maxwell Technologies  
All rights reserved.  

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