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74LVC1G38GX PDF预览

74LVC1G38GX

更新时间: 2024-11-18 11:10:31
品牌 Logo 应用领域
安世 - NEXPERIA /
页数 文件大小 规格书
17页 256K
描述
2-input NAND gate; open drainProduction

74LVC1G38GX 数据手册

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74LVC1G38  
2-input NAND gate; open drain  
Rev. 10 — 12 January 2022  
Product data sheet  
1. General description  
The 74LVC1G38 is a single 2-input NAND gate with open-drain output. Inputs can be driven from  
either 3.3 V or 5 V devices. This feature allows the use of these devices as translators in mixed  
3.3 V and 5 V environments.  
Schmitt-trigger action at all inputs makes the circuit tolerant of slower input rise and fall times.  
This device is fully specified for partial power down applications using IOFF. The IOFF circuitry  
disables the output, preventing the potentially damaging backflow current through the device when  
it is powered down.  
2. Features and benefits  
Wide supply voltage range from 1.65 V to 5.5 V  
5 V tolerant outputs for interfacing with 5 V logic  
High noise immunity  
±24 mA output drive (VCC = 3.0 V)  
CMOS low power consumption  
Open drain outputs  
Direct interface with TTL levels  
Inputs accept voltages up to 5 V  
Latch-up performance exceeds 250 mA  
Complies with JEDEC standard:  
JESD8-7 (1.65 V to 1.95 V)  
JESD8-5 (2.3 V to 2.7 V)  
JESD8-B/JESD36 (2.7 V to 3.6 V).  
ESD protection:  
HBM JESD22-A114F exceeds 2000 V  
MM JESD22-A115-A exceeds 200 V  
Multiple package options  
Specified from -40 °C to +125 °C.  
 
 

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