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74HC74BQ-Q100 PDF预览

74HC74BQ-Q100

更新时间: 2024-11-12 01:08:35
品牌 Logo 应用领域
安世 - NEXPERIA /
页数 文件大小 规格书
19页 798K
描述
Dual D-type flip-flop with set and reset; positive edge-trigger

74HC74BQ-Q100 数据手册

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74HC74-Q100; 74HCT74-Q100  
Dual D-type flip-flop with set and reset; positive edge-trigger  
Rev. 3 — 4 December 2015  
Product data sheet  
1. General description  
The 74HC74-Q100; 74HCT74-Q100 are dual positive edge triggered D-type flip-flop with  
individual data (nD), clock (nCP), set (nSD) and reset (nRD) inputs, and complementary  
nQ and nQ outputs. Data at the nD-input, that meets the set-up and hold time  
requirements on the LOW-to-HIGH clock transition, will be stored in the flip-flop and  
appear at the nQ output. The Schmitt-trigger action in the clock input, makes the circuit  
highly tolerant to slower clock rise and fall times. Inputs include clamp diodes. This  
enables the use of current limiting resistors to interface inputs to voltages in excess of  
VCC  
.
This product has been qualified to the Automotive Electronics Council (AEC) standard  
Q100 (Grade 1) and is suitable for use in automotive applications.  
2. Features and benefits  
Automotive product qualification in accordance with AEC-Q100 (Grade 1)  
Specified from 40 C to +85 C and from 40 C to +125 C  
Input levels:  
For 74HC74-Q100: CMOS level  
For 74HCT74-Q100: TTL level  
Symmetrical output impedance  
Low power dissipation  
High noise immunity  
Balanced propagation delays  
Specified in compliance with JEDEC standard no. 7A  
ESD protection:  
MIL-STD-883, method 3015 exceeds 2000 V  
HBM JESD22-A114F exceeds 2000 V  
MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 )  
Multiple package options  

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