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74AUP2G00GT PDF预览

74AUP2G00GT

更新时间: 2024-11-20 11:12:31
品牌 Logo 应用领域
安世 - NEXPERIA /
页数 文件大小 规格书
20页 297K
描述
Low-power dual 2-input NAND gateProduction

74AUP2G00GT 数据手册

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74AUP2G00  
Low-power dual 2-input NAND gate  
Rev. 12 — 14 July 2023  
Product data sheet  
1. General description  
The 74AUP2G00 provides dual 2-input NAND function.  
Schmitt trigger action at all inputs makes the circuit tolerant to slower input rise and fall times  
across the entire VCC range from 0.8 V to 3.6 V.  
This device ensures a very low static and dynamic power consumption across the entire VCC range  
from 0.8 V to 3.6 V.  
This device is fully specified for partial power-down applications using IOFF. The IOFF circuitry  
disables the output, preventing a damaging backflow current through the device when it is powered  
down.  
2. Features and benefits  
Wide supply voltage range from 0.8 V to 3.6 V  
High noise immunity  
Complies with JEDEC standards:  
JESD8-12 (0.8 V to 1.3 V)  
JESD8-11 (0.9 V to 1.65 V)  
JESD8-7 (1.2 V to 1.95 V)  
JESD8-5 (1.8 V to 2.7 V)  
JESD8-B (2.7 V to 3.6 V)  
Low static power consumption; ICC = 0.9 μA (maximum)  
Latch-up performance exceeds 100 mA per JESD78 Class II  
Inputs accept voltages up to 3.6 V  
Low noise overshoot and undershoot < 10 % of VCC  
IOFF circuitry provides partial power-down mode operation  
ESD protection:  
HBM: ANSI/ESDA/JEDEC JS-001 class 3A exceeds 5000 V  
CDM: ANSI/ESDA/JEDEC JS-002 class C3 exceeds 1000 V  
Multiple package options  
Specified from -40 °C to +85 °C and -40 °C to +125 °C  
 
 

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