http://www.fujielectric.com/products/semiconductor/
6MBP200VDA060-50
IGBT MODULE (V series)
600V / 200A / IPM
IGBT Modules
Features
• Temperature protection provided by directly detecting
the junction temperature of the IGBTs
• Low power loss and soft switching
• High performance and high reliability IGBT with overheating
protection
• Higher reliability because of a big decrease in number of
parts in built-in control circuit
Maximum Ratings and Characteristics
Absolute Maximum Ratings (T =25ºC, VCC=15V unless otherwise specified)
C
Items
Symbol
Min.
Max.
Units
Collector-Emitter Voltage (*1)
Short Circuit Voltage
V
V
CES
SC
0
600
400
200
400
200
462
-
V
V
200
DC
IC
-
A
Collector Current
1ms
Icp
-
A
Duty=50.3% (*2)
-IC
-
A
Collector Power Dissipation 1 device (*3)
P
C
-
W
A
DC
I
I
I
C
-
Collector Current
1ms
cp
F
-
-
A
Forward Current of Diode
Collector Power Dissipation 1 device (*3)
Supply Voltage of Pre-Driver (*4)
Input Signal Voltage (*5)
-
-
-
A
P
V
V
V
C
-
W
V
CC
in
-0.5
-0.5
-0.5
-
20
V
CC+0.5
V
Alarm Signal Voltage (*6)
Alarm Signal Current (*7)
Junction Temperature
ALM
V
CC
V
I
ALM
20
150
mA
ºC
ºC
ºC
ºC
Vrms
T
T
T
T
j
-
Operating Case Temperature
Storage Temperature
opr
stg
sol
-20
-40
-
110
125
Solder Temperature (*8)
260
Isolating Voltage (*9)
V
iso
-
AC2500
Terminal (M4)
Screw Torque
-
-
1.7
Nm
Mounting (M4)
Note *1: VCES shall be applied to the input voltage between terminal P-(U,V, W) and (U,V, W, B)-N.
Note *2: Duty=125ºC/Rth(j-c)D /(I ×V Max.)×100
Note *3: P =125ºC/Rth(j-c)Q (Inverter & Brake)
F
F
C
Note *4: VCC shall be applied to the input voltage between terminal No.4 and 1, 8 and 5, 12 and 9, 14 and 13.
Note *5: Vin shall be applied to the input voltage between terminal No.3 and 1, 7 and 5, 11 and 9, 15~18 and 13.
Note *6: VALM shall be applied to the voltage between terminal No.2 and 1, 6 and 5, 10 and 9, 19 and 13.
Note *7: IALM shall be applied to the input current to terminal No.2,6,10 and 19.
Note *8: Immersion time 10±1sec. 1time.
Note *9: Terminal to base, 50/60Hz sine wave 1min. All terminals should be connected together during the test.
1