ꢀꢁꢂ ꢃ ꢄꢅ ꢆꢇ ꢈ ꢃ ꢈ ꢉ ꢀꢁ ꢊꢃ ꢄꢅ ꢆꢇ ꢈꢃ ꢈ
ꢀꢋ ꢄꢁ ꢆ ꢌꢀꢆ ꢍꢌꢎ ꢏ ꢋꢌ ꢀ ꢐꢏ ꢆꢑ
ꢒ ꢋꢆꢄꢓ ꢅꢔꢀ ꢆ ꢕꢄꢁꢀ ꢋꢌꢏ ꢎꢌꢕꢀ ꢄꢁꢍ ꢕꢌ ꢖ ꢏꢀ ꢆꢌ ꢕ ꢀ
SCBS123F − AUGUST 1992 − REVISED APRIL 2004
SN54ABT8646 . . . JT PACKAGE
SN74ABT8646 . . . DL OR DW PACKAGE
(TOP VIEW)
D
D
Members of the Texas Instruments
SCOPE Family of Testability Products
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
1
28
27
26
25
24
23
22
21
20
19
18
17
16
15
CLKAB
SAB
DIR
A1
A2
A3
GND
A4
A5
CLKBA
SBA
OE
2
3
D
D
Functionally Equivalent to ’F646 and
’ABT646 in the Normal-Function Mode
4
B1
B2
B3
B4
5
SCOPE Instruction Set
6
− IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
7
8
V
CC
9
B5
B6
B7
B8
TDI
TCK
− Parallel-Signature Analysis at Inputs
With Masking Option
− Pseudorandom Pattern Generation From
Outputs
− Sample Inputs/Toggle Outputs
− Binary Count From Outputs
− Even-Parity Opcodes
10
11
12
13
14
A6
A7
A8
TDO
TMS
D
D
D
Two Boundary-Scan Cells Per I/O for
Greater Flexibility
SN54ABT8646 . . . FK PACKAGE
(TOP VIEW)
State-of-the-Art EPIC-ΙΙB BiCMOS Design
Significantly Reduces Power Dissipation
Package Options Include Plastic
Small-Outline (DW) and Shrink
Small-Outline (DL) Packages, Ceramic Chip
Carriers (FK), and Standard Ceramic DIPs
(JT)
4
3
2 1 28 27 26
5
25
24
23
22
21
20
19
B7
B8
OE
SBA
CLKBA
CLKAB
SAB
6
7
TDI
TCK
TMS
TDO
A8
8
9
10
11
description
DIR
A1
The ’ABT8646 and scan-test devices with octal
bus transceivers and registers are members of the
Texas Instruments SCOPE testability
12 13 14 15 16 17 18
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F646 and ’ABT646 octal bus transceivers
and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing
at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE octal bus transceivers and registers.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments.
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Copyright 2004, Texas Instruments Incorporated
ꢒ ꢙ ꢤ ꢜ ꢛꢧ ꢢꢡ ꢟꢠ ꢡꢛ ꢝꢤ ꢦꢘ ꢞꢙ ꢟ ꢟꢛ ꢮꢏ ꢓꢯ ꢗꢕ ꢰ ꢯꢱꢇꢂ ꢱꢂꢉ ꢞꢦꢦ ꢤꢞ ꢜ ꢞ ꢝꢣ ꢟꢣꢜ ꢠ ꢞ ꢜ ꢣ ꢟꢣ ꢠꢟꢣ ꢧ
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ꢢ ꢙꢦ ꢣꢠꢠ ꢛ ꢟꢩꢣ ꢜ ꢫꢘ ꢠꢣ ꢙ ꢛꢟꢣ ꢧꢨ ꢒ ꢙ ꢞꢦ ꢦ ꢛ ꢟꢩꢣ ꢜ ꢤꢜ ꢛ ꢧꢢꢡ ꢟꢠ ꢉ ꢤꢜ ꢛ ꢧꢢꢡ ꢟꢘꢛ ꢙ
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