5秒后页面跳转
捷配首页

Datasheet > 逻辑 > 总线驱动器/收发器> 5962-9172801Q3A
5962-9172801Q3A PDF预览

5962-9172801Q3A

更新时间： 2024-02-17 20:14:20
品牌 Logo 应用领域
德州仪器 - TI 总线驱动器总线收发器逻辑集成电路测试信息通信管理
页数 文件大小 规格书
27页 484K
描述
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

阅读下载

中文翻译

获取价格

5962-9172801Q3A 技术参数

生命周期：Active零件包装代码：QFN
包装说明：QCCN,针数：28
Reach Compliance Code：compliantHTS代码：8542.39.00.01
风险等级：5.48控制类型：COMMON CONTROL
计数方向：BIDIRECTIONAL系列：BCT/FBT
JESD-30 代码：S-CQCC-N28长度：11.43 mm
逻辑集成电路类型：BOUNDARY SCAN BUS TRANSCEIVER最大I（ol）：0.048 A
位数：1功能数量：8
端口数量：2端子数量：28
最高工作温度：125 °C最低工作温度：-55 °C
输出特性：3-STATE输出极性：TRUE
封装主体材料：CERAMIC, METAL-SEALED COFIRED封装代码：QCCN
封装形状：SQUARE封装形式：CHIP CARRIER
峰值回流温度（摄氏度）：NOT SPECIFIED最大电源电流（ICC）：52 mA
Prop。Delay @ Nom-Sup：11 ns传播延迟（tpd）：11 ns
认证状态：Qualified筛选级别：MIL-PRF-38535 Class Q
座面最大高度：2.03 mm最大供电电压 (Vsup)：5.5 V
最小供电电压 (Vsup)：4.5 V标称供电电压 (Vsup)：5 V
表面贴装：YES技术：BICMOS
温度等级：MILITARY端子形式：NO LEAD
端子节距：1.27 mm端子位置：QUAD
处于峰值回流温度下的最长时间：NOT SPECIFIED翻译：N/A
宽度：11.43 mmBase Number Matches：1

5962-9172801Q3A 数据手册

 浏览型号5962-9172801Q3A的Datasheet PDF文件第2页浏览型号5962-9172801Q3A的Datasheet PDF文件第3页浏览型号5962-9172801Q3A的Datasheet PDF文件第4页浏览型号5962-9172801Q3A的Datasheet PDF文件第5页浏览型号5962-9172801Q3A的Datasheet PDF文件第6页浏览型号5962-9172801Q3A的Datasheet PDF文件第7页 
SN54BCT8245A, SN74BCT8245A  
SCAN TEST DEVICES  
WITH OCTAL BUS TRANSCEIVERS  
SCBS043E – MAY 1990 – REVISED JULY 1996  
SN54BCT8245A . . . JT PACKAGE  
SN74BCT8245A . . . DW OR NT PACKAGE  
(TOP VIEW)  
Members of the Texas Instruments  
SCOPE Family of Testability Products  
Octal Test-Integrated Circuits  
Functionally Equivalent to ’F245 and  
’BCT245 in the Normal- Function Mode  
DIR  
B1  
B2  
B3  
B4  
GND  
B5  
B6  
B7  
B8  
1
2
3
4
5
6
7
8
9
10  
24 OE  
23 A1  
22 A2  
21 A3  
20 A4  
19 A5  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
Test Operation Synchronous to Test  
Access Port (TAP)  
18  
V
CC  
17 A6  
16 A7  
Implement Optional Test Reset Signal by  
Recognizing a Double-High-Level Voltage  
(10 V) on TMS Pin  
15  
A8  
TDO 11  
TMS 12  
14 TDI  
13 TCK  
SCOPE Instruction Set  
– IEEE Standard 1149.1-1990 Required  
Instructions, Optional INTEST, CLAMP,  
and HIGHZ  
– Parallel-Signature Analysis at Inputs  
– Pseudo-Random Pattern Generation  
From Outputs  
SN54BCT8245A . . . FK PACKAGE  
(TOP VIEW)  
– Sample Inputs/Toggle Outputs  
4
3
2
1
28 27 26  
25  
5
6
7
8
9
A2  
A1  
OE  
NC  
DIR  
B1  
A8  
TDI  
TCK  
Package Options Include Plastic  
24  
23  
Small-Outline (DW) Packages, Ceramic  
Chip Carriers (FK), and Standard Plastic  
and Ceramic 300-mil DIPs (JT, NT)  
22 NC  
21 TMS  
20 TDO  
19 B8  
10  
11  
description  
B2  
The ’BCT8245A scan test devices with octal bus  
transceivers are members of the Texas  
12 13 14 15 16 17 18  
Instruments SCOPE  
testability integrated-  
circuit family. This family of devices supports IEEE  
Standard 1149.1-1990 boundary scan to facilitate  
testing of complex circuit-board assemblies. Scan  
access to the test circuitry is accomplished via the  
4-wire test access port (TAP) interface.  
NC – No internal connection  
In the normal mode, these devices are functionally equivalent to the ’F245 and ’BCT245 octal bus transceivers.  
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device  
terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect  
the functional operation of the SCOPE octal bus transceivers.  
In the test mode, the normal operation of the SCOPE octal bus transceivers is inhibited and the test circuitry  
is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform  
boundary-scan test operations as described in IEEE Standard 1149.1-1990.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE is a trademark of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...27

中文翻译

下载PDF

5962-9172801Q3A 替代型号

型号 品牌 替代类型 描述 数据表
SNJ54BCT8245AFK TI

完全替代

 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SNJ54BCT8245AJT TI

类似代替

 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
5962-9172801QLA TI

类似代替

 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

与5962-9172801Q3A相关器件

型号 品牌 获取价格 描述 数据表
5962-9172801Q3X ETC

获取价格

 		Single 8-bit Bus Transceiver
5962-9172801QLA TI

获取价格

 		SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
5962-9172801QLX ETC

获取价格

 		Single 8-bit Bus Transceiver
5962-9172901MVX ETC

获取价格

 		Transceiver
5962-9172902MEX ETC

获取价格

 		Transceiver
5962-9172903MVX ETC

获取价格

 		Transceiver
5962-9172904MEX ETC

获取价格

 		Transceiver
5962-9173401HXA WEDC

获取价格

 		Line Transceiver, 1 Func, 1 Driver, 1 Rcvr, DIP-78
5962-9173401HXX ETC

获取价格

 		MIL-STD-1553/ARINC Bus Controller/RTU
5962-9173401HYA WEDC

获取价格

 		Line Transceiver, 1 Func, 1 Driver, 1 Rcvr, DFP-82

与5962-9172801Q3A相关文章

您还可以找


热门产品
PCB打样/小批量
铝基板
BOM智能配单
PCBA制造
钣金
精密CNC
模具注塑
薄膜开关
精选活动
PCBA打样特惠
四六层板品质升级
铝基板品质升级
一体化电子制造
DFM下载
服务支持
企业认证
产品展示
工厂展示
工艺能力
积分商城
关于捷配
捷配简介
企业文化
公司动态
人才招聘
联系我们
帮助中心
下单流程
付款流程
开票流程
常见问题
全球PCB制造服务专线 400-613-0088

工作时间：9:00-21:00

CEO邮箱：ceo@jiepei.com

投诉邮箱：tousu@jiepei.com

捷配网-微信公众号 微信公众号
捷配网-微信公众号 抖音公众号
资质认证：
合作快递：
支付方式：
Copyright © 2024 Jiepei.com Inc. All Rights Reserved. 版权所有:杭州捷配信息科技有限公司 浙公网安备 33010502006866号 浙ICP备10014259号-119 营业执照ICP证