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54FCT533FMQB PDF预览

54FCT533FMQB

更新时间: 2024-01-09 16:25:41
品牌 Logo 应用领域
其他 - ETC 逻辑集成电路驱动PC
页数 文件大小 规格书
5页 19K
描述
LATCH|SINGLE|8-BIT|FCT/PCT-CMOS|FP|20PIN|CERAMIC

54FCT533FMQB 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:QCCN, LCC20,.35SQReach Compliance Code:compliant
风险等级:5.92JESD-30 代码:S-XQCC-N20
JESD-609代码:e0负载电容(CL):50 pF
逻辑集成电路类型:D LATCH最大I(ol):0.048 A
位数:8功能数量:1
端子数量:20最高工作温度:125 °C
最低工作温度:-55 °C输出特性:3-STATE
封装主体材料:CERAMIC封装代码:QCCN
封装等效代码:LCC20,.35SQ封装形状:SQUARE
封装形式:CHIP CARRIER包装方法:TAPE AND REEL
电源:5 VProp。Delay @ Nom-Sup:10 ns
认证状态:Not Qualified子类别:FF/Latches
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子面层:Tin/Lead (Sn/Pb)端子形式:NO LEAD
端子节距:1.27 mm端子位置:QUAD
Base Number Matches:1

54FCT533FMQB 数据手册

 浏览型号54FCT533FMQB的Datasheet PDF文件第2页浏览型号54FCT533FMQB的Datasheet PDF文件第3页浏览型号54FCT533FMQB的Datasheet PDF文件第4页浏览型号54FCT533FMQB的Datasheet PDF文件第5页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 01/04/94  
Last Update Date: 04/09/99  
MN54FCT533-X REV 0A0  
Last Major Revision Date: 08/25/94  
Octal Transparent Latch With 3-State Outputs  
General Description  
The FCT533 consists of eight latches with TRI-STATE outputs for bus organized system  
applications. The flip-flops appear transparent to the data when the Latch Enable (LE) is  
HIGH. When LE is LOW, the data that meets the setup times is latched. Data appears on  
the bus when the Output Enable (OE) is LOW. When OE is HIGH the bus output is in the high  
impedance state. FACT TM FCT utilizes NSC quiet series technology to provide improved  
quiet output switching and dynamic threshold performance. FACT FCT features GTO TM output  
control and undershoot corrector in addition to a split ground bus for superior  
performance. The FCT533 is the same as the FCT373, except that the outputs are inverted.  
Industry Part Number  
NS Part Numbers  
54FCT533  
54FCT533DMQB  
54FCT533FMQB  
54FCT533LMQB  
Prime Die  
Y533  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
2
Static tests at  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
Quality Conformance Inspection  
5
6
MIL-STD-883, Method 5005  
7
8A  
8B  
9
10  
11  
1

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