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54F74DC PDF预览

54F74DC

更新时间: 2024-01-17 10:55:22
品牌 Logo 应用领域
其他 - ETC 触发器逻辑集成电路
页数 文件大小 规格书
6页 20K
描述
FLIP-FLOP|DUAL|D TYPE|F-TTL|DIP|14PIN|CERAMIC

54F74DC 技术参数

生命周期:Obsolete零件包装代码:DIP
包装说明:DIP,针数:14
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.27系列:F/FAST
JESD-30 代码:R-CDIP-T14逻辑集成电路类型:D FLIP-FLOP
位数:1功能数量:2
端子数量:14最高工作温度:125 °C
最低工作温度:-55 °C输出极性:COMPLEMENTARY
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:DIP
封装形状:RECTANGULAR封装形式:IN-LINE
传播延迟(tpd):10.5 ns认证状态:Not Qualified
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:NO
技术:TTL温度等级:MILITARY
端子形式:THROUGH-HOLE端子位置:DUAL
触发器类型:POSITIVE EDGE最小 fmax:125 MHz
Base Number Matches:1

54F74DC 数据手册

 浏览型号54F74DC的Datasheet PDF文件第2页浏览型号54F74DC的Datasheet PDF文件第3页浏览型号54F74DC的Datasheet PDF文件第4页浏览型号54F74DC的Datasheet PDF文件第5页浏览型号54F74DC的Datasheet PDF文件第6页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 06/25/97  
Last Update Date: 07/08/97  
CN54F74-X REV 0A0  
Last Major Revision Date: 06/25/97  
DUAL D-TYPE POSITIVE EDGE-TRIGGERED FLIP-FLOP  
General Description  
The F74 is a dual D-type flip-flop with Direct Clear and Set inputs and complementary  
(Q/Q) outputs. Information at the input is transferred to the outputs on the positive  
edge of the clock pulse. Clock triggering occurs at a voltage level of the clock pulse  
and is not directly related to the transition time of the positive-going pulse. After the  
Clock Pulse Input threshold voltage has been passed, the Data inputs is locked out and  
information present will not be transferred to the outputs until the next rising edge of  
the Clock Pulse input.  
Asynchronous Inputs:  
LOW Input to Sd sets Q to HIGH level  
LOW Input to Cd sets Q to LOW level  
Clear and Set are Independent of clock  
Simultaneous LOW on Cd and Sd makes both Q and Q HIGH  
Industry Part Number  
NS Part Numbers  
54F74  
54F74DC  
Prime Die  
M074  
Processing  
Subgrp Description  
Temp (oC)  
1
Static tests at  
+25  
+70  
0
+25  
+70  
0
+25  
+70  
0
+25  
+70  
0
2
Static tests at  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
Quality Conformance Inspection  
5
6
7
8A  
8B  
9
10  
11  
1

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