Datasheet > 54F132LMQB

54F132LMQB

更新时间： 2024-01-25 22:09:49

品牌	Logo	应用领域
其他 - ETC		输入元件
页数	文件大小	规格书
4页	17K
描述
LOGIC GATE\|QUAD 2-INPUT NAND\|F-TTL\|LLCC\|20PIN\|CERAMIC

阅读下载

获取价格

技术参数
数据手册

如果您发现信息不准确，欢迎纠错

54F132LMQB 技术参数

生命周期：	Obsolete	零件包装代码：	SOIC
包装说明：	SOP,	针数：	14
Reach Compliance Code：	unknown	HTS代码：	8542.39.00.01
风险等级：	5.72	系列：	F/FAST
JESD-30 代码：	R-PDSO-G14	长度：	10.11 mm
逻辑集成电路类型：	NAND GATE	功能数量：	4
输入次数：	2	端子数量：	14
最高工作温度：	70 °C	最低工作温度：
封装主体材料：	PLASTIC/EPOXY	封装代码：	SOP
封装形状：	RECTANGULAR	封装形式：	SMALL OUTLINE
传播延迟（tpd）：	13 ns	认证状态：	Not Qualified
座面最大高度：	2.108 mm	最大供电电压 (Vsup)：	5.5 V
最小供电电压 (Vsup)：	4.5 V	标称供电电压 (Vsup)：	5 V
表面贴装：	YES	技术：	TTL
温度等级：	COMMERCIAL	端子形式：	GULL WING
端子节距：	1.27 mm	端子位置：	DUAL
宽度：	5.3 mm	Base Number Matches：	1

54F132LMQB 数据手册

MILITARY DATA SHEET

Original Creation Date: 03/13/96

Last Update Date: 07/30/96

MN54F132-X REV 1A0

Last Major Revision Date: 03/13/96

QUAD 2-INPUT NAND SCHMITT TRIGGER

General Description

The F132 contains four 2-Input NAND gates which accept standard TTL input signals and

provide standard TTL output levels. They are capable of transforming slowly changing

input signals into sharply defined, jitter-free output signals. In addition, they have a

greater noise margin than conventional NAND gates.

Each circuit contains a 2-Input Schmitt trigger followed by a Darlington level shifter and

a phase splitter driving a TTL totem-pole output. The Schmitt trigger uses positive

feedback to effectively speed-up slow input transitions, and provide different input

threshold voltages for positive and negative-going transitions. This hysteresis between

the positive-going and negative-going input threshold (typically 800 mV) is determined by

resistor ratios and is essentially insensitive to temperature and supply voltage

variations.

Industry Part Number

NS Part Numbers

54F132

54F132DMQB

54F132FMQB

54F132LMQB

Prime Die

M132

Processing

Subgrp Description

Temp (^oC)

MIL-STD-883, Method 5004

Static tests at

+25

Static tests at

+125

-55

Static tests at

Dynamic tests at

Functional tests at

Switching tests at

+25

Quality Conformance Inspection

+125

-55

MIL-STD-883, Method 5005

+25

+125

-55

+25

+125

-55

12 3 4

下载PDF

与54F132LMQB相关器件

型号	品牌	描述	获取价格	数据表
54F132LMX	TI	IC F/FAST SERIES, QUAD 2-INPUT NAND GATE, CQCC20, CERAMIC, LCC-20, Gate	获取价格
54F132M/B2AJC	ETC	Quad 2-input NAND Gate	获取价格
54F132PCX	TI	暂无描述	获取价格
54F132SCQB	TI	F/FAST SERIES, QUAD 2-INPUT NAND GATE, PDSO14, 0.150 INCH, PLASTIC, SOIC-14	获取价格
54F132SDMQB	FAIRCHILD	NAND Gate, F/FAST Series, 4-Func, 2-Input, TTL, CDIP14, SLIM, CERAMIC, DIP-14	获取价格
54F132SJCX	TI	F/FAST SERIES, QUAD 2-INPUT NAND GATE, PDSO14, 0.300 INCH, EIAJ, PLASTIC, SOIC-14	获取价格