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54F10DC PDF预览

54F10DC

更新时间: 2024-01-03 16:08:37
品牌 Logo 应用领域
其他 - ETC 输入元件
页数 文件大小 规格书
5页 18K
描述
LOGIC GATE|3 3-INPUT NAND|F-TTL|DIP|14PIN|PLASTIC

54F10DC 技术参数

生命周期:Obsolete零件包装代码:DIP
包装说明:DIP,针数:14
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.14系列:F/FAST
JESD-30 代码:R-CDIP-T14逻辑集成电路类型:NAND GATE
功能数量:3输入次数:3
端子数量:14最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装代码:DIP封装形状:RECTANGULAR
封装形式:IN-LINE传播延迟(tpd):6.5 ns
认证状态:Not Qualified最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:NO技术:TTL
温度等级:MILITARY端子形式:THROUGH-HOLE
端子位置:DUALBase Number Matches:1

54F10DC 数据手册

 浏览型号54F10DC的Datasheet PDF文件第2页浏览型号54F10DC的Datasheet PDF文件第3页浏览型号54F10DC的Datasheet PDF文件第4页浏览型号54F10DC的Datasheet PDF文件第5页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 06/25/97  
Last Update Date: 07/08/97  
CN54F10-X REV 0A0  
Last Major Revision Date: 06/25/97  
TRIPLE 3-INPUT NAND GATE  
General Description  
This device contains three independent gates, each of which performs the logic NAND  
function.  
Industry Part Number  
NS Part Numbers  
54F10  
54F10DC  
Prime Die  
M010  
Processing  
Subgrp Description  
Temp (oC)  
(blank)  
1
Static tests at  
+25  
+70  
0
+25  
+70  
0
+25  
+70  
0
+25  
+70  
0
2
Static tests at  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
Quality Conformance Inspection  
5
6
(blank)  
7
8A  
8B  
9
10  
11  
1

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