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54ACTQ273DMQB PDF预览

54ACTQ273DMQB

更新时间: 2024-02-01 13:33:18
品牌 Logo 应用领域
其他 - ETC /
页数 文件大小 规格书
7页 22K
描述
FLIP-FLOP|OCTAL|D TYPE|ACT-CMOS|DIP|20PIN|CERAMIC

54ACTQ273DMQB 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DFP, FL20,.3Reach Compliance Code:compliant
HTS代码:8542.39.00.01风险等级:5.13
系列:ACTJESD-30 代码:R-GDFP-F20
JESD-609代码:e0负载电容(CL):50 pF
逻辑集成电路类型:D FLIP-FLOP最大频率@ Nom-Sup:85000000 Hz
最大I(ol):0.024 A湿度敏感等级:1
位数:8功能数量:1
端子数量:20最高工作温度:125 °C
最低工作温度:-55 °C输出极性:TRUE
封装主体材料:CERAMIC, GLASS-SEALED封装代码:DFP
封装等效代码:FL20,.3封装形状:RECTANGULAR
封装形式:FLATPACK电源:5 V
Prop。Delay @ Nom-Sup:11 ns传播延迟(tpd):10 ns
认证状态:Not Qualified筛选级别:MIL-PRF-38535 Class V
座面最大高度:2.286 mm子类别:FF/Latches
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子面层:Tin/Lead (Sn63Pb37)端子形式:FLAT
端子节距:1.27 mm端子位置:DUAL
总剂量:100k Rad(Si) V触发器类型:POSITIVE EDGE
宽度:6.731 mm最小 fmax:95 MHz
Base Number Matches:1

54ACTQ273DMQB 数据手册

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MICROCIRCUIT DATA SHEET  
Original Creation Date: 07/15/96  
Last Update Date: 05/25/99  
MN54ACTQ273-X REV 2A0  
Last Major Revision Date: 03/19/99  
Octal D-Type Flip-Flop With Master Reset  
General Description  
The ACTQ273 has eight edge-triggered D-type flip-flops with individual D inputs and Q  
outputs. The common buffered Clock (CP) and Master Reset (MR) input load and reset  
(clear) all flip-flops simultaneously.  
The register is fully edge-triggered. The state of each D input, one setup time before  
the LOW-to-HIGH clock transition, is transferred to the corresponding flip-flop's Q  
output.  
All outputs will be forced LOW independently of Clock or Data inputs by a LOW voltage  
level on the MR input. The device is useful for applications where the true output only  
is required and the Clock and Master Reset are common to all storage elements.  
The ACTQ utilizes NSC Quiet Series technology to guarantee quiet output switching and  
improve dynamic threshold performance. FACT Quiet Series TM features GTO TM output  
control and undershoot corrector in addition to a split group bus for superior  
performance.  
Industry Part Number  
NS Part Numbers  
54ACTQ273  
54ACTQ273DMQB*  
54ACTQ273FMQB**  
54ACTQ273LMQB***  
Prime Die  
D273  
Controlling Document  
5962-89735  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
2
Static tests at  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
Quality Conformance Inspection  
5
6
MIL-STD-883 5005  
7
8A  
8B  
9
10  
11  
1

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