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54ACTQ241LMQB PDF预览

54ACTQ241LMQB

更新时间: 2024-02-16 23:57:46
品牌 Logo 应用领域
其他 - ETC 驱动
页数 文件大小 规格书
7页 21K
描述
BUFFER/DRIVER|DUAL|4-BIT|ACT-CMOS|LLCC|20PIN|CERAMIC

54ACTQ241LMQB 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DFP, FL20,.3Reach Compliance Code:compliant
HTS代码:8542.39.00.01风险等级:5.35
控制类型:ENABLE LOW/HIGH系列:ACT
JESD-30 代码:R-GDFP-F20JESD-609代码:e0
负载电容(CL):50 pF逻辑集成电路类型:BUS DRIVER
最大I(ol):0.024 A湿度敏感等级:1
位数:4功能数量:2
端口数量:2端子数量:20
最高工作温度:125 °C最低工作温度:-55 °C
输出特性:3-STATE输出极性:TRUE
封装主体材料:CERAMIC, GLASS-SEALED封装代码:DFP
封装等效代码:FL20,.3封装形状:RECTANGULAR
封装形式:FLATPACK电源:5 V
Prop。Delay @ Nom-Sup:8 ns传播延迟(tpd):8 ns
认证状态:Not Qualified筛选级别:MIL-PRF-38535 Class V
座面最大高度:2.286 mm子类别:Bus Driver/Transceivers
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子面层:Tin/Lead (Sn63Pb37)端子形式:FLAT
端子节距:1.27 mm端子位置:DUAL
宽度:6.731 mmBase Number Matches:1

54ACTQ241LMQB 数据手册

 浏览型号54ACTQ241LMQB的Datasheet PDF文件第2页浏览型号54ACTQ241LMQB的Datasheet PDF文件第3页浏览型号54ACTQ241LMQB的Datasheet PDF文件第4页浏览型号54ACTQ241LMQB的Datasheet PDF文件第5页浏览型号54ACTQ241LMQB的Datasheet PDF文件第6页浏览型号54ACTQ241LMQB的Datasheet PDF文件第7页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 07/15/96  
Last Update Date: 03/09/99  
MN54ACTQ241-X REV 2A0  
Last Major Revision Date: 12/17/98  
Octal Buffer/Line Driver with TRI-STATE Outputs  
General Description  
The ACTQ241 is an octal buffer and line driver designed to be employed as a memory address  
driver, clock driver and bus oriented transmitter or receiver which provides improved PC  
board density. The ACTQ utilzes NSC Quiet Series technology to guarantee quiet output  
switching and improved dynamic threshold performance. FACT Quiet Series TM features GTO  
TM output control and undershoot corrector in addition to a split ground bus for superior  
performance.  
Industry Part Number  
NS Part Numbers  
54ACTQ241  
54ACTQ241DMQB*  
54ACTQ241FMQB**  
54ACTQ241LMQB***  
Prime Die  
D241  
Controlling Document  
5962-92185  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
2
Static tests at  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
Quality Conformance Inspection  
5
6
MIL-STD-883 5005  
7
8A  
8B  
9
10  
11  
1

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