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54ACTQ14LMQBX PDF预览

54ACTQ14LMQBX

更新时间: 2024-02-11 05:49:27
品牌 Logo 应用领域
德州仪器 - TI 输入元件逻辑集成电路
页数 文件大小 规格书
7页 20K
描述
ACT SERIES, HEX 1-INPUT INVERT GATE, CQCC20, LCC-20

54ACTQ14LMQBX 技术参数

生命周期:Obsolete包装说明:QCCN,
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.69Is Samacsys:N
系列:ACTJESD-30 代码:S-CQCC-N20
长度:8.89 mm负载电容(CL):50 pF
逻辑集成电路类型:INVERTER功能数量:6
输入次数:1端子数量:20
最高工作温度:125 °C最低工作温度:-55 °C
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:QCCN
封装形状:SQUARE封装形式:CHIP CARRIER
传播延迟(tpd):12.5 ns认证状态:Not Qualified
筛选级别:MIL-STD-883座面最大高度:1.905 mm
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子形式:NO LEAD端子节距:1.27 mm
端子位置:QUAD宽度:8.89 mm
Base Number Matches:1

54ACTQ14LMQBX 数据手册

 浏览型号54ACTQ14LMQBX的Datasheet PDF文件第2页浏览型号54ACTQ14LMQBX的Datasheet PDF文件第3页浏览型号54ACTQ14LMQBX的Datasheet PDF文件第4页浏览型号54ACTQ14LMQBX的Datasheet PDF文件第5页浏览型号54ACTQ14LMQBX的Datasheet PDF文件第6页浏览型号54ACTQ14LMQBX的Datasheet PDF文件第7页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 07/12/96  
Last Update Date: 11/10/03  
MN54ACTQ14-X REV 2A0  
Last Major Revision Date: 09/17/03  
Hex Inverter With Schmidt Trigger Input  
General Description  
The ACTQ14 contains six inverter gates each with a Schmitt trigger input. they are  
capable of transforming slowly changing input signals into sharply defined, jitter-free  
output signals. In addition they have a greater noise margin than conventional inverters.  
The ACTQ14 utilizes NSC Quiet Series Technology to guarantee quiet output switching and  
improve dynamic threshold performance. FACT Quiet Series TM features GTO TM output  
control and undershoot corrector in addition to a split ground bus for superior  
performance.  
The ACTQ14 has hysteresis between the positive-going and negative-going input thresholds  
(typically 1.0V) which is determined internally by transistor ratios and is essentially  
insensitive to temperature and supply voltage variations.  
Industry Part Number  
NS Part Numbers  
54ACTQ14  
54ACTQ14DMQB  
54ACTQ14FMQB  
54ACTQ14LMQB  
Prime Die  
D014  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
2
Static tests at  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
Quality Conformance Inspection  
5
6
MIL-STD-883 5005  
7
8A  
8B  
9
10  
11  
1

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