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2SC6142 PDF预览

2SC6142

更新时间: 2024-11-18 12:50:51
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体开关晶体管功率双极晶体管
页数 文件大小 规格书
5页 212K
描述
High Voltage Switching Applications

2SC6142 技术参数

Source Content uid:2SC6142是否Rohs认证:不符合
生命周期:ActiveObjectid:2064548488
包装说明:SMALL OUTLINE, R-PSSO-F3针数:3
Reach Compliance Code:unknowncompound_id:5369510
风险等级:5.81最大集电极电流 (IC):1.5 A
集电极-发射极最大电压:375 V配置:SINGLE
最小直流电流增益 (hFE):100JESD-30 代码:R-PSSO-F3
元件数量:1端子数量:3
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:NPN最大功率耗散 (Abs):1.1 W
认证状态:Not Qualified子类别:Other Transistors
表面贴装:YES端子形式:FLAT
端子位置:SINGLE晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

2SC6142 数据手册

 浏览型号2SC6142的Datasheet PDF文件第2页浏览型号2SC6142的Datasheet PDF文件第3页浏览型号2SC6142的Datasheet PDF文件第4页浏览型号2SC6142的Datasheet PDF文件第5页 
2SC6142  
TOSHIBA Transistor Silicon NPN Triple Diffused Type  
2SC6142  
Unit: mm  
High Voltage Switching Applications  
Switching Regulator Applications  
DC-DC Converter Applications  
6.5±0.2  
5.2±0.2  
0.6 MAX.  
Excellent switching times: t = 0.15 μs (typ.)  
f
1.1±0.2  
0.6 MAX  
0.9  
High collector breakdown voltage: V  
= 800 V, V  
= 375 V  
CES  
CEO  
2.3 2.3  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
0.6±0.15  
0.6±0.15  
0.8 MAX.  
1.1 MAX.  
Collector-base voltage  
V
800  
800  
V
V
V
V
CBO  
V
CES  
CEO  
EBO  
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
1. BASE  
2. COLLECTOR  
3. EMITTER  
V
V
375  
8
DC  
I
1.5  
C
A
JEDEC  
JEITA  
Pulse  
I
3
CP  
Base current  
I
0.75  
1.1  
A
B
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
W
°C  
°C  
C
TOSHIBA  
2-7J2A  
T
j
150  
Weight: 0.32 g (typ.)  
T
55 to 150  
stg  
Note 1: Ensure that the channel temperature does not exceed 150°C during use of the device.  
Note 2: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2010-04-23  

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