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2SC6139(TPF2,Q) PDF预览

2SC6139(TPF2,Q)

更新时间: 2024-11-18 14:48:43
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
5页 185K
描述
TRANSISTOR,BJT,NPN,160V V(BR)CEO,1.5A I(C),SC-71VAR

2SC6139(TPF2,Q) 技术参数

是否Rohs认证:符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.61Is Samacsys:N
最大集电极电流 (IC):1.5 A配置:Single
最小直流电流增益 (hFE):140最高工作温度:150 °C
极性/信道类型:NPN最大功率耗散 (Abs):1 W
子类别:Other Transistors表面贴装:NO
Base Number Matches:1

2SC6139(TPF2,Q) 数据手册

 浏览型号2SC6139(TPF2,Q)的Datasheet PDF文件第2页浏览型号2SC6139(TPF2,Q)的Datasheet PDF文件第3页浏览型号2SC6139(TPF2,Q)的Datasheet PDF文件第4页浏览型号2SC6139(TPF2,Q)的Datasheet PDF文件第5页 
2SC6139  
TOSHIBA Transistor Silicon NPN Epitaxial Type  
2SC6139  
Audio Frequency Amplifier Applications  
Unit: mm  
High collector voltage  
: V  
= 160 V (min)  
CEO  
Small collector output capacitance : C = 12pF (typ.)  
ob  
High transition frequency  
: f = 100MHz (typ.)  
T
Complementary to 2SA2219  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
160  
V
V
Collector-emitter voltage  
Emitter-base voltage  
160  
6
1.5  
V
A
DC  
I
C
Collector current  
Pulse  
I
2.5  
A
A
CP  
Base current  
I
0.5  
B
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
1
W
°C  
°C  
C
JEDEC  
JEITA  
T
150  
j
T
stg  
55 to 150  
TOSHIBA  
2-7D101A  
Note 1: Ensure that the channel temperature does not exceed 150°C  
during use of the device.  
Weight : 0.2 g (typ.)  
Note 2: Using continuously under heavy loads (e.g. the application of  
high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to  
decrease in the reliability significantly even if the operating conditions (i.e. operating  
temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2009-09-28  

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