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2SC6135,LF PDF预览

2SC6135,LF

更新时间: 2024-10-30 18:15:47
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
4页 282K
描述
Small Signal Bipolar Transistor

2SC6135,LF 技术参数

生命周期:Active包装说明:,
Reach Compliance Code:unknownFactory Lead Time:12 weeks
风险等级:5.75Base Number Matches:1

2SC6135,LF 数据手册

 浏览型号2SC6135,LF的Datasheet PDF文件第2页浏览型号2SC6135,LF的Datasheet PDF文件第3页浏览型号2SC6135,LF的Datasheet PDF文件第4页 
2SC6135  
TOSHIBA Transistor Silicon NPN Epitaxial Type  
2SC6135  
High-Speed Switching Applications  
Unit: mm  
DC-DC Converter Applications  
Strobe Applications  
2.1±0.1  
1.7±0.1  
High DC current gain: h = 400 to 1000 (I = 0.1A)  
FE  
C
1
2
Low collector-emitter saturation voltage: V  
= 0.17 V (max)  
CE (sat)  
3
High-speed switching: t = 85 ns (typ.)  
f
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
100  
80  
V
V
V
V
CBO  
Collector-emitter voltage  
Collector-emitter voltage  
Emitter-base voltage  
V
CEX  
CEO  
EBO  
1: Base  
2: Emitter  
3: Collector  
V
V
50  
7
UFM  
DC  
I
1.0  
C
Collector current  
A
A
Pulse  
I
2.0  
JEDEC  
JEITA  
CP  
Base current  
I
0.1  
B
P
(Note 1)  
(Note 2)  
800  
500  
150  
-55 to 150  
C
C
Collector power dissipation  
TOSHIBA  
2-2U1A  
mW  
P
Weight: 6.6 mg (typ.)  
Junction temperature  
T
°C  
°C  
j
Storage temperature range  
T
stg  
Note 1: Mounted on ceramic board.  
(25.4 mm × 25.4 mm × 0.8 mm, Cu Pad: 645 mm2 )  
Note 2: Mounted on FR4 board.  
(25.4 mm × 25.4 mm × 1.6 mm, Cu Pad: 645 mm2 )  
Note 3: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant  
change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating  
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling  
Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated  
failure rate, etc).  
Start of commercial production  
2007-08  
© 2009-2017  
Toshiba Electronic Devices & Storage Corporation  
2017-07-31  
1

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