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2SC6127 PDF预览

2SC6127

更新时间: 2024-11-18 21:04:31
品牌 Logo 应用领域
东芝 - TOSHIBA 开关晶体管
页数 文件大小 规格书
5页 151K
描述
TRANSISTOR 50 mA, 800 V, NPN, Si, SMALL SIGNAL TRANSISTOR, ROHS COMPLIANT, 2-7J1A, 3 PIN, BIP General Purpose Small Signal

2SC6127 技术参数

生命周期:Active包装说明:SMALL OUTLINE, R-PSSO-G2
针数:3Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.29.00.95
风险等级:5.52外壳连接:COLLECTOR
最大集电极电流 (IC):0.05 A集电极-发射极最大电压:800 V
配置:SINGLE最小直流电流增益 (hFE):15
JESD-30 代码:R-PSSO-G2元件数量:1
端子数量:2封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:NPN认证状态:Not Qualified
表面贴装:YES端子形式:GULL WING
端子位置:SINGLE晶体管应用:SWITCHING
晶体管元件材料:SILICON标称过渡频率 (fT):15 MHz
Base Number Matches:1

2SC6127 数据手册

 浏览型号2SC6127的Datasheet PDF文件第2页浏览型号2SC6127的Datasheet PDF文件第3页浏览型号2SC6127的Datasheet PDF文件第4页浏览型号2SC6127的Datasheet PDF文件第5页 
2SC6127  
TOSHIBA Transistor Silicon NPN Triple Diffused Type  
2SC6127  
High Voltage Switching Applications  
Unit: mm  
High Voltage Amplifier Applications  
High voltage: V  
= 800 V  
CEO  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
800  
V
V
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
800  
5
50  
V
I
mA  
mA  
C
Base current  
I
25  
B
Ta = 25°C  
Tc = 25°C  
1.0  
Collector power  
dissipation  
P
W
C
10  
Junction temperature  
T
150  
°C  
°C  
j
Storage temperature range  
T
stg  
55 to 150  
JEDEC  
JEITA  
Note1: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the  
absolute maximum ratings.  
TOSHIBA  
2-7J1A  
Weight: 0.36 g (typ.)  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Start of commercial production  
2008-11  
1
2013-11-01  

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