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2SC6000

更新时间: 2024-11-04 12:50:51
品牌 Logo 应用领域
东芝 - TOSHIBA 转换器开关
页数 文件大小 规格书
5页 181K
描述
High Speed Switching Applications DC-DC Converter Applications

2SC6000 技术参数

生命周期:Active零件包装代码:SC-64
包装说明:2-7J1A, SC-64, 3 PIN针数:3
Reach Compliance Code:unknownECCN代码:EAR99
风险等级:5.42外壳连接:COLLECTOR
最大集电极电流 (IC):7 A集电极-发射极最大电压:50 V
配置:SINGLE最小直流电流增益 (hFE):250
JESD-30 代码:R-PSSO-G2JESD-609代码:e0
元件数量:1端子数量:2
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:NPN最大功率耗散 (Abs):20 W
认证状态:Not Qualified子类别:Other Transistors
表面贴装:YES端子面层:TIN LEAD
端子形式:GULL WING端子位置:SINGLE
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

2SC6000 数据手册

 浏览型号2SC6000的Datasheet PDF文件第2页浏览型号2SC6000的Datasheet PDF文件第3页浏览型号2SC6000的Datasheet PDF文件第4页浏览型号2SC6000的Datasheet PDF文件第5页 
2SC6000  
TOSHIBA Transistor Silicon NPN Epitaxial Type  
2SC6000  
High Speed Switching Applications  
Unit: mm  
DC-DC Converter Applications  
High DC current gain: h  
= 250 to 400 (I = 2.5 A)  
FE C  
Low collector-emitter saturation: V  
= 0.18 V (max)  
CE (sat)  
High speed switching: t = 13 ns (typ)  
f
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
120  
120  
50  
V
V
V
V
CBO  
Collector-emitter voltage  
Collector-emitter voltage  
Emitter-base voltage  
V
CEX  
CEO  
EBO  
V
V
6
DC  
I
7.0  
10.0  
0.5  
C
Collector current  
A
Pulse  
I
CP  
Base current  
I
A
B
JEDEC  
JEITA  
Collector power  
dissipation  
Tc = 25°C  
P
20  
W
C
TOSHIBA  
2-7J1A  
Junction temperature  
T
150  
°C  
°C  
j
Storage temperature range  
T
stg  
55 to 150  
Weight: 0.36 g (typ.)  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in temperature, etc.) may cause this product to  
decrease in the reliability significantly even if the operating conditions (i.e. operating  
temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
1
2006-11-13  

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