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2SC5976(TE85L)

更新时间: 2024-01-15 07:19:39
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
5页 182K
描述
TRANSISTOR,BJT,NPN,30V V(BR)CEO,3A I(C),SOT-346

2SC5976(TE85L) 技术参数

是否Rohs认证: 不符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.69最大集电极电流 (IC):3 A
配置:Single最小直流电流增益 (hFE):250
最高工作温度:150 °C极性/信道类型:NPN
最大功率耗散 (Abs):1 W子类别:Other Transistors
表面贴装:YESBase Number Matches:1

2SC5976(TE85L) 数据手册

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2SC5976  
TOSHIBA Transistor Silicon NPN Epitaxial Type  
2SC5976  
High-Speed Switching Applications  
Unit: mm  
DC-DC Converter Applications  
Strobe Flash Applications  
+0.2  
2.8-0.3  
+0.2  
1.6-0.1  
High DC current gain: h  
= 250 to 400 (I = 0.3 A)  
FE C  
1
2
Low collector-emitter saturation voltage: V  
= 0.14 V (max)  
CE (sat)  
High-speed switching: t = 25 ns (typ.)  
f
3
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
50  
50  
V
V
V
V
V
CBO  
V
Collector-emitter voltage  
Collector-emitter voltage  
Emitter-base voltage  
CEX  
CEO  
EBO  
1.Base  
2.Emitter  
3.Collector  
30  
V
V
6
I
3.0  
DC  
C
Collector current  
Base current  
A
A
JEDEC  
I
5.0  
Pulse  
CP  
JEITA  
0.3  
I
B
TOSHIBA  
23S1C  
1.00  
0.625  
150  
Collector power dissipation (t=10s)  
Total collector power dissipation (DC)  
Junction temperature  
P
(Note.1)  
W
C
T
j
°C  
°C  
Storage temperature range  
T
stg  
55 to 150  
Note 1: Mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm2)  
Note 2: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2006-11-13  

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