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2SC5810(TE12L,F) PDF预览

2SC5810(TE12L,F)

更新时间: 2024-09-26 14:48:43
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
5页 150K
描述
TRANSISTOR NPN 50V 1A SC-62

2SC5810(TE12L,F) 技术参数

是否Rohs认证:符合生命周期:Active
Reach Compliance Code:unknown风险等级:5.53
Is Samacsys:NBase Number Matches:1

2SC5810(TE12L,F) 数据手册

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2SC5810  
TOSHIBA Transistor Silicon NPN Epitaxial Type  
2SC5810  
High-Speed Switching Applications  
Unit: mm  
DC-DC Converter Applications  
Strobe Applications  
High DC current gain: h = 400 to 1000 (I = 0.1 A)  
FE  
C
Low collector-emitter saturation voltage: V  
= 0.17 V (max)  
CE (sat)  
High-speed switching: t = 85 ns (typ.)  
f
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
100  
80  
CBO  
V
CEX  
CEO  
EBO  
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
V
V
V
V
50  
7
DC  
I
1.0  
C
A
JEDEC  
JEITA  
Pulse  
I
2.0  
CP  
SC-62  
2-5K1A  
Base current  
I
0.1  
A
B
DC  
2.0  
TOSHIBA  
Collector power  
dissipation  
P
(Note 1)  
W
C
t = 10 s  
1.0  
Weight: 0.05 g (typ.)  
Junction temperature  
T
150  
55 to 150  
°C  
°C  
j
Storage temperature range  
T
stg  
Note 1: Mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm2)  
Note 2: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2009-12-21  

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