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2SA2182 PDF预览

2SA2182

更新时间: 2024-11-14 21:02:35
品牌 Logo 应用领域
东芝 - TOSHIBA 局域网放大器晶体管
页数 文件大小 规格书
5页 185K
描述
TRANSISTOR 1 A, 230 V, PNP, Si, POWER TRANSISTOR, LEAD FREE, SC-67, 2-10U1A, 3 PIN, BIP General Purpose Power

2SA2182 技术参数

生命周期:Transferred零件包装代码:SC-67
包装说明:LEAD FREE, 2-10U1A, SC-67, 3 PIN针数:3
Reach Compliance Code:unknown风险等级:5.46
外壳连接:ISOLATED最大集电极电流 (IC):1 A
集电极-发射极最大电压:230 V配置:SINGLE
最小直流电流增益 (hFE):100JESD-30 代码:R-PSFM-T3
元件数量:1端子数量:3
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:FLANGE MOUNT
极性/信道类型:PNP认证状态:Not Qualified
表面贴装:NO端子形式:THROUGH-HOLE
端子位置:SINGLE晶体管应用:AMPLIFIER
晶体管元件材料:SILICON标称过渡频率 (fT):80 MHz
Base Number Matches:1

2SA2182 数据手册

 浏览型号2SA2182的Datasheet PDF文件第2页浏览型号2SA2182的Datasheet PDF文件第3页浏览型号2SA2182的Datasheet PDF文件第4页浏览型号2SA2182的Datasheet PDF文件第5页 
2SA2182  
TOSHIBA Transistor Silicon PNP Epitaxial Type  
2SA2182  
Unit: mm  
Power Amplifier Applications  
Driver Stage Amplifier Applications  
High transition frequency: f = 80 MHz (typ.)  
T
Absolute Maximum Ratings (Tc = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
230  
230  
5  
V
V
Collector-emitter voltage  
Emitter-base voltage  
V
DC  
I
1.0  
2.0  
100  
2
A
C
Collector current  
pulse  
I
A
CP  
1 : BASE  
2 : COLLECTOR  
3 : EMITTER  
Base current  
I
mA  
W
W
°C  
°C  
B
Ta = 25°C  
Tc = 25°C  
JEDEC  
JEITA  
Collector power dissipation  
P
C
20  
SC-67  
Junction temperature  
T
150  
j
TOSHIBA  
2-10U1A  
Storage temperature range  
T
stg  
55~150  
Weight: 1.7 g (typ.)  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in temperature, etc.) may cause this product to  
decrease in the reliability significantly even if the operating conditions (i.e. operating  
temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
1
2006-11-13  

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