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2SA1242(2-7B2A) PDF预览

2SA1242(2-7B2A)

更新时间: 2024-11-25 14:20:19
品牌 Logo 应用领域
东芝 - TOSHIBA 放大器晶体管
页数 文件大小 规格书
4页 149K
描述
TRANSISTOR 5000 mA, 20 V, PNP, Si, SMALL SIGNAL TRANSISTOR, 2-7B2A, 3 PIN, BIP General Purpose Small Signal

2SA1242(2-7B2A) 技术参数

是否Rohs认证:不符合生命周期:Obsolete
包装说明:SMALL OUTLINE, R-PSSO-G2针数:3
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.29.00.75风险等级:5.8
Is Samacsys:N外壳连接:COLLECTOR
最大集电极电流 (IC):5 A集电极-发射极最大电压:20 V
配置:SINGLE最小直流电流增益 (hFE):70
JESD-30 代码:R-PSSO-G2元件数量:1
端子数量:2最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:PNP认证状态:Not Qualified
表面贴装:YES端子形式:GULL WING
端子位置:SINGLE处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:AMPLIFIER晶体管元件材料:SILICON
标称过渡频率 (fT):170 MHzBase Number Matches:1

2SA1242(2-7B2A) 数据手册

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2SA1242  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process)  
2SA1242  
Unit: mm  
Strobe Flash Applications  
Medium Power Amplifier Applications  
Excellent h  
linearity  
FE  
: h  
: h  
= 100 to 320 (V  
= 2 V, I = 0.5 A)  
FE (1)  
FE (2)  
CE C  
= 70 (min) (V  
= 2 V, I = 4 A)  
C
CE  
Low collector saturation voltage  
: V = 1.0 V (max) (I = 4 A, I = 0.1 A)  
CE (sat)  
C
B
High power dissipation  
: P = 10 W (Tc = 25°C), P = 1.0 W (Ta = 25°C)  
C
C
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
35  
20  
8  
V
V
V
Collector-emitter voltage  
Emitter-base voltage  
JEDEC  
JEITA  
DC  
I
5  
C
Collector current  
Base current  
A
TOSHIBA  
2-7J1A  
Pulsed  
I
8  
CP  
(Note 1)  
Weight: 0.36 g (typ.)  
I
0.5  
1.0  
A
B
Ta = 25°C  
Tc = 25°C  
Collector power  
dissipation  
P
W
C
10  
Junction temperature  
T
150  
°C  
°C  
j
Storage temperature range  
T
stg  
55 to 150  
Note 1: Pulse test: Pulse width = 10 ms (max), duty cycle = 30% (max)  
Note 2: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2010-08-27  

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