2N7002A
SEMICONDUCTOR
N CHANNEL ENHANCEMENT MODE
FIELD EFFECT TRANSISTOR
TECHNICAL DATA
INTERFACE AND SWITCHING APPLICATION.
FEATURES
E
L
B
L
High density cell design for low RDS(ON)
Voltage controolled small signal switch.
Rugged and reliable.
.
DIM MILLIMETERS
_
2.93+ 0.20
A
B
C
D
E
1.30+0.20/-0.15
1.30 MAX
0.45+0.15/-0.05
2.40+0.30/-0.20
1.90
2
3
High saturation current capablity.
1
G
H
J
0.95
0.13+0.10/-0.05
0.00 ~ 0.10
0.55
K
L
P
P
MAXIMUM RATING (Ta=25
)
M
N
P
0.20 MIN
1.00+0.20/-0.10
7
CHARACTERISTIC
Drain-Source Voltage
SYMBOL
VDSS
VDGR
VGSS
ID
RATING
UNIT
V
M
60
60
V
Drain-Gate Voltage (RGS
Gate-Source Voltage
1
)
1. SOURCE
2. GATE
V
20
115
800
200
150
3. DRAIN
Continuous
Pulsed
Drain Current
mA
IDP
PD
Drain Power Dissipation
Junction Temperature
mW
SOT-23
Tj
Tstg
Storage Temperature Range
-55 150
Marking
EQUIVALENT CIRCUIT
Lot No.
D
Type Name
WB
G
S
THIS TRANSISTOR IS ELECTROSTATIC SENSITIVE DEVICE.
PLEASE HANDLE WITH CAUTION.
ELECTRICAL CHARACTERISTICS (Ta=25
)
CHARACTERISTIC
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate-Body Leakage, Forward
Gate-Body Leakage, Reverse
SYMBOL
BVDSS
IDSS
TEST CONDITION
MIN.
TYP.
MAX.
UNIT
V
60
-
-
-
-
-
-
1
VGS=0V, ID=10 A
VDS=60V, VGS=0V
VGS=20V, VDS=0V
VGS=-20V, VDS=0V
A
IGSSF
-
1
A
IGSSR
-
-1
A
2009. 7. 2
Revision No : 7
1/4