20DL2CZ47A,20FL2CZ47A
TOSHIBA HIGH EFFICIENCY DIODE STACK (HED) SILICON EPITAXIAL TYPE
20DL2CZ47A, 20FL2CZ47A
SWITCHING MODE POWER SUPPLY APPLICATION
Unit: mm
CONVERTER & CHOPPER APPLICATION
z Repetitive Peak Reverse Voltage
: V
= 200 V, 300 V
RRM
z Average Output Rectified Current : I = 20 A
O
z Ultra Fast Reverse-Recovery Time : t = 35 ns (Max)
rr
z Low Switching Losses and Low Output Noise
ABSOLUTE MAXIMUM RATINGS (Ta = 25°C)
CHARACTERISTIC
SYMBOL
RATING
UNIT
V
20DL2CZ47A
20FL2CZ47A
200
300
Repetitive Peak
Reverse Voltage
V
RRM
Average Output Rectified Current
(Full Sine Waveform)
I
20
A
A
O
100 (50H )
z
Peak One Cycle Surge Forward
Current (Non−Repetitive)
I
FSM
110 (60H )
z
JEDEC
―
―
Junction Temperature
Storage Temperature Range
Screw Torque
T
−40~150
−40~150
0.6
°C
°C
j
JEITA
T
stg
TOSHIBA
Weight: 2.0g
12−10C1A
―
N·m
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in temperature, etc.) may cause this product to
decrease in the reliability significantly even if the operating conditions (i.e. operating
temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
ELECTRICAL CHARACTERISTICS (Ta = 25°C)
CHARACTERISTIC
SYMBOL
TEST CONDITION
MIN
TYP.
MAX
UNIT
V
20DL2CZ47A
20FL2CZ47A
Repetitive Peak Reverse Current
―
―
―
―
0.98
1.3
Peak Forward
Voltage (Note 1)
V
I
= 10A
FM
FM
I
V
= Rated
RRM
―
―
50
μA
RRM
(Note 1)
Reverse Recovery Time
Forward Recovery Time
Thermal Resistance
(Note 1)
(Note 1)
t
I
I
= 2.0A, di / dt = −50A / μs
―
―
―
―
―
―
35
100
3.0
ns
ns
rr
F
F
t
= 1.0A
fr
R
DC Total, Junction to Case
°C / W
th (j−c)
Note 1: A value applied to one cell.
POLARITY
1
2006-11-08