1SS385F
TOSHIBA Diode Silicon Epitaxial Schottky Barrier Type
1SS385F
High Speed Switching
Unit: mm
z Low forward voltage: V = 0.23V (typ.) @I = 5mA
F
F
z Ultra-small package
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Maximum (peak) reverse Voltage
Reverse voltage
V
15
10
V
V
RM
V
R
Maximum (peak) forward current
Average forward current
Surge current (10ms)
I
200 (*)
100 (*)
1 (*)
mA
mA
A
FM
I
O
I
FSM
P
Power dissipation
100 (*)
125
mW
°C
°C
°C
Junction temperature
T
j
Storage temperature range
Operating temperature range
T
−55~125
−40~100
stg
opr
T
JEDEC
―
―
―
EIAJ
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
TOSHIBA
Weight: 2.3 g
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are
within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
*:
Unit rating. Total rating = unit rating × 1.5
Electrical Characteristics (Ta = 25°C)
Test
Circuit
Characteristic
Symbol
Test Condition
= 1mA
Min.
Typ.
Max.
Unit
V
V
V
―
―
―
―
―
I
I
I
―
―
―
―
―
0.18
0.23
0.35
―
―
0.30
0.50
20
V
V
V
F (1)
F (2)
F (3)
F
F
F
Forward voltage
= 5mA
= 100mA
= 10V
Reverse current
I
V
V
μA
R
R
Total capacitance
C
T
= 0, f = 1MH
z
20
40
pF
R
Equivalent Circuit (Top View)
Marking
1
2007-11-01